Inventor · disambiguated record
Katsuichi Kitagawa
Also filed as: KITAGAWA KATSUICHI
7 granted patents·97 citations·filing 1974–2016
85Inventor score
Top patents by PatentIndex Score
7 records- 0178US6501553B1Surface profile measuring method and apparatusTORAY ENG CO LTD·Filed 2000·Granted Dec 31, 2002·28 cites·20 claims
- 0271US7852489B2Method for measuring surface profile, and apparatus using the sameTOKYO INST TECH·Filed 2007·Granted Dec 14, 2010·8 cites·8 claims
- 0370US4693608AMethod and apparatus for determining position of points on articleTORAY INDUSTRIES·Filed 1985·Granted Sep 15, 1987·26 cites·4 claims
- 0464US8831910B2Method of measuring defect density of single crystalSHINTANI YOSHITOMO·Filed 2010·Granted Sep 9, 2014·3 cites·8 claims
- 0557US4124342AApparatus for controlling the gap between lips of a die for extruding a plastic sheet materialTORAY INDUSTRIES·Filed 1976·Granted Nov 7, 1978·18 cites·15 claims
- 0649US3985845AMethod for controlling the gap between lips of a die for extruding a plastic sheet materialTORAY INDUSTRIES·Filed 1974·Granted Oct 12, 1976·14 cites·6 claims
- 0728US10274307B2Film thickness measurement device using interference of light and film thickness measurement method using interference of lightTORAY ENG CO LTD·Filed 2016·Granted Apr 30, 2019·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →