Inventor · disambiguated record
Kang-Woong Ko
Also filed as: KO KANG M · KO KANG-WOONG
7 granted patents·5 pending applications·23 citations·filing 2006–2024
79Inventor score
Top patents by PatentIndex Score
12 records- 0190US9841688B2Method for detecting overlay error and method for manufacturing semiconductor device using the sameKO KANG-WOONG·Filed 2015·Granted Dec 12, 2017·11 cites·20 claims
- 0287US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0383US9267879B2Ellipsometer for detecting surfaceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 23, 2016·5 cites·12 claims
- 0470US10551326B2Method for measuring semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 4, 2020·2 cites·16 claims
- 0556US8454113B2Ink discharge device of inkjet head and control method thereofPAENG DONG WOO·Filed 2010·Granted Jun 4, 2013·1 cites·18 claims
- 0654US2025035564A1Substrate test methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0750US2007066215A1Air conditioning apparatusSONG CHANG H·Filed 2006·Application pending·0 cites
- 0845US8506045B2Inkjet head cleaning apparatus and methodKO KANG WOONG·Filed 2011·Granted Aug 13, 2013·0 cites·12 claims
- 0941US2020194294A1Spectroscopic system, optical inspection method, and semiconductor device fabrication methodSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 1040US8585172B2Ink discharge apparatus and method of controlling the sameKO KANG WOONG·Filed 2011·Granted Nov 19, 2013·0 cites·12 claims
- 1134US2017200658A1Methods of inspecting substrates and semiconductor fabrication methods incorporating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
- 1234US2018144995A1Optical inspection apparatus and method and method of fabricating semiconductor device using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Kang-Woong Ko files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →