Inventor · disambiguated record
Kathi Kreske
Also filed as: KRESKE KATHI · KRESKE KATHI M
2 granted patents·51 citations·filing 1987–1992
65Inventor score
Files withROTLEX OPTICS LTD2
Top patents by PatentIndex Score
2 records- 0163US4854708AOptical examination apparatus particularly useful as a Fizeau interferometer and schlieren deviceROTLEX OPTICS LTD·Filed 1987·Granted Aug 8, 1989·25 cites·13 claims
- 0262US5355210AMethod and apparatus for measuring optical properties of optical devicesROTLEX OPTICS LTD·Filed 1992·Granted Oct 11, 1994·26 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →