Inventor · disambiguated record
Kay C. Lannen
Also filed as: LANNEN KAY C
9 granted patents·1 pending application·222 citations·filing 1992–2003
90Inventor score
Top patents by PatentIndex Score
10 records- 0180US6263476B1Method and apparatus for selecting targeted components in limited access testAGILENT TECHNOLOGIES INC·Filed 1998·Granted Jul 17, 2001·48 cites·34 claims
- 0275US5262716ATester calibration procedure which includes fixturingHEWLETT PACKARD CO·Filed 1992·Granted Nov 16, 1993·48 cites·17 claims
- 0363US5412575APay-per-use access to multiple electronic test capabilitiesHEWLETT PACKARD CO·Filed 1993·Granted May 2, 1995·46 cites·26 claims
- 0457US6334100B1Method and apparatus for electronic circuit model correctionAGILENT TECHNOLOGIES INC·Filed 1998·Granted Dec 25, 2001·23 cites·28 claims
- 0549US5581463APay-per-use access to multiple electronic test capabilities and tester resourcesHEWLETT PACKARD CO·Filed 1994·Granted Dec 3, 1996·24 cites·21 claims
- 0642US5481463APay-per-use access to multiple electronic test capabilitiesHEWLETT PACKARD CO·Filed 1995·Granted Jan 2, 1996·16 cites·23 claims
- 0741US2004189717A1Intelligent drill-down for graphical user interfaceFiled 2003·Application pending·0 cites
- 0838US6266787B1Method and apparatus for selecting stimulus locations during limited access circuit testAGILENT TECHNOLOGIES INC·Filed 1998·Granted Jul 24, 2001·8 cites·31 claims
- 0937US6467051B1Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit testAGILENT TECHNOLOGIES INC·Filed 1998·Granted Oct 15, 2002·7 cites·12 claims
- 1030US6233706B1Method and apparatus for limited access circuit testAGILENT TECHNOLOGIES INC·Filed 1998·Granted May 15, 2001·2 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →