Inventor · disambiguated record
Katie T. Liszewski
Also filed as: LISZEWSKI KATIE · LISZEWSKI KATIE T
7 granted patents·4 pending applications·10 citations·filing 2018–2024
78Inventor score
Files withBATTELLE MEMORIAL INSTITUTE11
Top patents by PatentIndex Score
11 records- 0188US11906578B2System and method for rapid inspection of printed circuit board using multiple modalitiesBATTELLE MEMORIAL INSTITUTE·Filed 2020·Granted Feb 20, 2024·3 cites·24 claims
- 0288US11756157B2Multimodal inspection systemBATTELLE MEMORIAL INSTITUTE·Filed 2021·Granted Sep 12, 2023·2 cites·20 claims
- 0384US11315840B2Assembly and method for performing in-situ endpoint detection when backside milling silicon based devicesBATTELLE MEMORIAL INSTITUTE·Filed 2020·Granted Apr 26, 2022·2 cites·19 claims
- 0479US12217170B2Data handling and machine learningBATTELLE MEMORIAL INSTITUTE·Filed 2021·Granted Feb 4, 2025·1 cites·17 claims
- 0576US2025086751A1Multimodal inspection systemBATTELLE MEMORIAL INSTITUTE·Filed 2024·Application pending·0 cites
- 0675US2025124285A1Data handling and machine learningBATTELLE MEMORIAL INSTITUTE·Filed 2024·Application pending·0 cites
- 0774US12154249B2Multimodal inspection systemBATTELLE MEMORIAL INSTITUTE·Filed 2023·Granted Nov 26, 2024·0 cites·20 claims
- 0872US10789550B2System and method for generating test vectorsBATTELLE MEMORIAL INSTITUTE·Filed 2018·Granted Sep 29, 2020·2 cites·29 claims
- 0971US2024142516A1System and method for rapid inspection of printed circuit board using multiple modalitiesBATTELLE MEMORIAL INSTITUTE·Filed 2024·Application pending·0 cites
- 1068US12444658B2Assembly and method for performing in-situ endpoint detection when backside milling silicon based devicesBATTELLE MEMORIAL INSTITUTE·Filed 2022·Granted Oct 14, 2025·0 cites·14 claims
- 1151US2023377127A1Non-destructive verification of integrated circuitsBATTELLE MEMORIAL INSTITUTE·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →