Inventor · disambiguated record
Karl L. Major
Also filed as: MAJOR KARL L
9 granted patents·5 pending applications·41 citations·filing 2002–2024
85Inventor score
Top patents by PatentIndex Score
14 records- 0187US11468960B2Semiconductor device with selective command delay and associated methods and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 11, 2022·3 cites·20 claims
- 0285US11335385B2Apparatuses including temperature-based threshold voltage compensated sense amplifiers and methods for compensating sameMICRON TECHNOLOGY INC·Filed 2020·Granted May 17, 2022·2 cites·21 claims
- 0384US11990195B2Semiconductor device with selective command delay and associated methods and systemsLODESTAR LICENSING GROUP LLC·Filed 2022·Granted May 21, 2024·1 cites·8 claims
- 0483US10796734B1Apparatuses including temperature-based threshold voltage compensated sense amplifiers and methods for compensating sameMICRON TECHNOLOGY INC·Filed 2019·Granted Oct 6, 2020·5 cites·25 claims
- 0578US11416333B2Semiconductor device with power-saving mode and associated methods and systemsMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 16, 2022·2 cites·20 claims
- 0672US6590819B1Digit line equilibration using time-multiplexed isolationMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 8, 2003·21 cites·22 claims
- 0768US12183416B2Apparatuses including temperature-based threshold voltage compensated sense amplifiers and methods for compensating sameMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 31, 2024·0 cites·20 claims
- 0868US2024304269A1Semiconductor device with selective command delay and associated methods and systemsLODESTAR LICENSING GROUP LLC·Filed 2024·Application pending·0 cites
- 0962US2022382628A1Semiconductor device with power-saving mode and associated methods and systemsMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
- 1051US7319935B2System and method for analyzing electrical failure dataMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 15, 2008·7 cites·66 claims
- 1140US2006265156A1System and method for analyzing electrical failure dataMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 1238US10998022B2Apparatuses and methods for reducing access device sub-threshold leakage in semiconductor devicesMICRON TECHNOLOGY INC·Filed 2019·Granted May 4, 2021·0 cites·24 claims
- 1337US2007162826A1Method for detecting error correction defectsMAJOR KARL L·Filed 2007·Application pending·0 cites
- 1435US2007061669A1Method, device and system for detecting error correction defectsMAJOR KARL L·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →