Inventor · disambiguated record
Kazuhiko Miki
Also filed as: MIKI KAZUHIKO
23 granted patents·1 pending application·219 citations·filing 1992–2011
95Inventor score
Top patents by PatentIndex Score
24 records- 0195US8278996B2Reference current generating circuitMIKI KAZUHIKO·Filed 2010·Granted Oct 2, 2012·62 cites·9 claims
- 0285US7245172B2Level shifter apparatus and method for minimizing duty cycle distortionIBM·Filed 2005·Granted Jul 17, 2007·13 cites·20 claims
- 0381US7350095B2Digital circuit to measure and/or correct duty cyclesIBM·Filed 2005·Granted Mar 25, 2008·9 cites·1 claims
- 0474US7716516B2Method for controlling operation of microprocessor which performs duty cycle correction processSONY COMPUTER ENTERTAINMENT INC·Filed 2006·Granted May 11, 2010·6 cites·20 claims
- 0571US7225092B2Method and apparatus for measuring and adjusting the duty cycle of a high speed clockIBM·Filed 2004·Granted May 29, 2007·15 cites·16 claims
- 0670US8736304B2Self-biased high speed level shifter circuitBOERSTLER DAVID WILLIAM·Filed 2005·Granted May 27, 2014·7 cites·10 claims
- 0770US7724056B2Semiconductor integrated circuit device operating in synchronism with clock and method for controlling duty of clockTOSHIBA KK·Filed 2008·Granted May 25, 2010·4 cites·20 claims
- 0869US6927635B2Lock detectors having a narrow sensitivity rangeIBM·Filed 2003·Granted Aug 9, 2005·22 cites·64 claims
- 0967US7265634B2System and method for phase-locked loop initializationTOSHIBA KK·Filed 2005·Granted Sep 4, 2007·9 cites·25 claims
- 1066US6021068ANonvolatile semiconductor memory with read circuit using flip-flop type sense amplifierTOSHIBA KK·Filed 1999·Granted Feb 1, 2000·24 cites·8 claims
- 1165US7917795B2Digital circuit to measure and/or correct duty cyclesIBM·Filed 2008·Granted Mar 29, 2011·2 cites·11 claims
- 1261US7747892B2System for automatically selecting intermediate power supply voltages for intermediate level shiftersIBM·Filed 2008·Granted Jun 29, 2010·3 cites·14 claims
- 1357US7019572B2Systems and methods for initializing PLLs and measuring VCO characteristicsIBM·Filed 2004·Granted Mar 28, 2006·9 cites·19 claims
- 1456US7176731B2Variation tolerant charge leakage correction circuit for phase locked loopsIBM·Filed 2004·Granted Feb 13, 2007·9 cites·15 claims
- 1555US7265600B2Level shifter system and method to minimize duty cycle error due to voltage differences across power domainsIBM·Filed 2005·Granted Sep 4, 2007·2 cites·18 claims
- 1650US7205853B2Method to configure phase-locked loop dividing ratioTOSHIBA KK·Filed 2005·Granted Apr 17, 2007·2 cites·13 claims
- 1749US7061223B2PLL manufacturing test apparatusIBM·Filed 2003·Granted Jun 13, 2006·5 cites·22 claims
- 1847US5270978ANonvolatile memory circuitTOSHIBA KK·Filed 1992·Granted Dec 14, 1993·11 cites·4 claims
- 1942US7519498B2Thermal sensing method and apparatus using existing ESD devicesIBM·Filed 2005·Granted Apr 14, 2009·0 cites·14 claims
- 2042US7392419B2System and method automatically selecting intermediate power supply voltages for intermediate level shiftersIBM·Filed 2005·Granted Jun 24, 2008·0 cites·6 claims
- 2142US7171318B2PLL filter leakage sensorIBM·Filed 2004·Granted Jan 30, 2007·2 cites·19 claims
- 2238US2010054042A1Semiconductor memory device and method of inspecting the sameTOSHIBA KK·Filed 2009·Application pending·0 cites
- 2331US5606524ANon-volatile semiconductor memory device capable of effecting high-speed operation with low voltageTOSHIBA KK·Filed 1996·Granted Feb 25, 1997·3 cites·2 claims
- 2428US8830758B2Semiconductor storage deviceIMAI SEIRO·Filed 2011·Granted Sep 9, 2014·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →