Inventor · disambiguated record
Kaoru Miyata
Also filed as: MIYATA KAORU
11 granted patents·2 pending applications·15 citations·filing 2009–2024
82Inventor score
Top patents by PatentIndex Score
13 records- 0179US7835411B2Laser frequency stabilizing device, method and programMITUTOYO CORP·Filed 2009·Granted Nov 16, 2010·6 cites·17 claims
- 0270US10317192B2Geometry measurement system, geometry measurement apparatus, and geometry measurement methodMITUTOYO CORP·Filed 2017·Granted Jun 11, 2019·2 cites·18 claims
- 0366US9525266B2Laser source device and adjustment method thereofMITUTOYO CORP·Filed 2016·Granted Dec 20, 2016·1 cites·4 claims
- 0465US11636614B2Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement methodMITUTOYO CORP·Filed 2022·Granted Apr 25, 2023·0 cites·12 claims
- 0565US10529082B2Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement methodMITUTOYO CORP·Filed 2018·Granted Jan 7, 2020·1 cites·20 claims
- 0665US8368900B2Lightwave interferometric distance measuring method and apparatus using an optical combMITUTOYO CORP·Filed 2009·Granted Feb 5, 2013·5 cites·5 claims
- 0760US11361458B2Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement methodMITUTOYO CORP·Filed 2020·Granted Jun 14, 2022·0 cites·12 claims
- 0860US2025045943A1Three-dimensional geometry measurement apparatus, threedimensional geometry measurement method, and storage mediumMITUTOYO CORP·Filed 2024·Application pending·0 cites
- 0947US11449970B2Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement methodMITUTOYO CORP·Filed 2021·Granted Sep 20, 2022·0 cites·9 claims
- 1046US11948321B2Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement methodMITUTOYO CORP·Filed 2020·Granted Apr 2, 2024·0 cites·9 claims
- 1142US10891746B2Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement methodMITUTOYO CORP·Filed 2019·Granted Jan 12, 2021·0 cites·11 claims
- 1239US2009310141A1Two-wavelength laser interferometer and method of adjusting optical axis in the sameMITUTOYO CORP·Filed 2009·Application pending·0 cites
- 1332US8081315B2Displacement measuring instrument and displacement measuring methodMIYATA KAORU·Filed 2009·Granted Dec 20, 2011·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →