Inventor · disambiguated record
Katsuki Nakajima
Also filed as: NAKAJIMA KATSUKI
8 granted patents·5 pending applications·62 citations·filing 2003–2023
84Inventor score
Top patents by PatentIndex Score
13 records- 0180US7475822B2Device for reading optical data codeOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Jan 13, 2009·11 cites·14 claims
- 0275US10542651B2Inspection apparatus and quality control system for surface mounting lineOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Jan 21, 2020·2 cites·17 claims
- 0371US6918539B2Method of and device for reading optical data codeOMRON TATEISI ELECTRONICS CO·Filed 2003·Granted Jul 19, 2005·20 cites·20 claims
- 0467US7100830B2Method of and device for reading optical codeOMRON TATEISI ELECTRONICS CO·Filed 2003·Granted Sep 5, 2006·12 cites·3 claims
- 0563US7278573B2Device for reading optical codeOMRON TATEISI ELECTRONICS CO·Filed 2006·Granted Oct 9, 2007·2 cites·1 claims
- 0661USD524813STwo-dimensional code readerOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Jul 11, 2006·15 cites·1 claims
- 0759US2025155881A1Production management system, production management method, and programOMRON TATEISI ELECTRONICS CO·Filed 2023·Application pending·0 cites
- 0853US10876977B2Inspection management system, inspection management apparatuses, and inspection management methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Dec 29, 2020·0 cites·20 claims
- 0952US2024061402A1Management system, management device, management method, and programOMRON TATEISI ELECTRONICS CO·Filed 2021·Application pending·0 cites
- 1049US2024085896A1Quality improvement assisting device and quality improvement assisting systemOMRON TATEISI ELECTRONICS CO·Filed 2021·Application pending·0 cites
- 1149US2024061405A1Management device and management systemOMRON TATEISI ELECTRONICS CO·Filed 2021·Application pending·0 cites
- 1245US11154001B2Inspection management system, inspection management apparatuses, and inspection management methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Oct 19, 2021·0 cites·12 claims
- 1344US2012185221A1Suitability determination method for determination standard value and method for specifying optimum value thereof, inspection system for substrate on which components are mounted, simulation method at production site, and simulation systemMORI HIROYUKI·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Katsuki Nakajima files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →