Inventor · disambiguated record
Kazuki Nakata
Also filed as: NAKATA KAZUKI
3 granted patents·1 pending application·128 citations·filing 1994–2016
74Inventor score
Top patents by PatentIndex Score
4 records- 0184US5828778AMethod and apparatus for analyzing failure of semiconductor waferMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Oct 27, 1998·100 cites·10 claims
- 0254US5621668APrediction control method and a prediction control deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Apr 15, 1997·20 cites·20 claims
- 0332US5923554AMethod for assessing the number and type of flawsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Jul 13, 1999·8 cites·11 claims
- 0432US2019033229A1Inspection device for sheet object, and inspection method for sheet objectTORAY INDUSTRIES·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →