Inventor · disambiguated record
Karoly Nemeth
Also filed as: NEMETH KAROLY · NEMETH KAROLY G
11 granted patents·1 pending application·153 citations·filing 1979–2020
88Inventor score
Files withBORON NITRIDE POWER LLC3IMAGE PROCESSING SYSTEMS INC3NEMETH KAROLY3MAGYAR TUDOMANYOS AKADEMIA1SCANTECH ELECTRONICS INC1
Top patents by PatentIndex Score
12 records- 0185US5969756ATest and alignment system for electronic display devices and test fixture for sameIMAGE PROCESSING SYSTEMS INC·Filed 1996·Granted Oct 19, 1999·75 cites·37 claims
- 0279US5317898AMethod and apparatus for detecting thickness variation in sheet materialSCANTECH ELECTRONICS INC·Filed 1992·Granted Jun 7, 1994·49 cites·7 claims
- 0378US10693137B2Functionalized boron nitride materials as electroactive species in electrochemical energy storage devicesNEMETH KAROLY·Filed 2014·Granted Jun 23, 2020·3 cites·12 claims
- 0475US8951671B1Ternary alkali-metal and transition metal or metalloid acetylides as alkali-metal intercalation electrodes for batteriesNEMETH KAROLY·Filed 2012·Granted Feb 10, 2015·3 cites·20 claims
- 0561US8729799B1Low-workfunction photocathodes based on acetylide compoundsTERDIK JOSEPH Z·Filed 2012·Granted May 20, 2014·3 cites·20 claims
- 0659US11453596B2Radical anion functionalization of two-dimensional materialsBORON NITRIDE POWER LLC·Filed 2020·Granted Sep 27, 2022·0 cites·19 claims
- 0753US11552296B2Functionalized boron nitride materials as electroactive species in electrochemical energy storage devicesBORON NITRIDE POWER LLC·Filed 2020·Granted Jan 10, 2023·0 cites·6 claims
- 0848US4304118AProcess and equipment for the thermal analysis of materialsMAGYAR TUDOMANYOS AKADEMIA·Filed 1979·Granted Dec 8, 1981·13 cites·17 claims
- 0939US8389178B2Electrochemical energy storage device based on carbon dioxide as electroactive speciesNEMETH KAROLY·Filed 2010·Granted Mar 5, 2013·0 cites·23 claims
- 1036US2019134585A1Synthesis of oxygen and boron trihalogenide functionalized two-dimensional layered materials in pressurized mediumBORON NITRIDE POWER LLC·Filed 2017·Application pending·0 cites
- 1135US6058221AElectron beam profile measurement method and systemIMAGE PROCESSING SYSTEMS INC·Filed 1998·Granted May 2, 2000·6 cites·32 claims
- 1228US6097355APurity/beam landing error measurement method for electronic display devicesIMAGE PROCESSING SYSTEMS INC·Filed 1997·Granted Aug 1, 2000·1 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →