Inventor · disambiguated record
Kaizao Ni
Also filed as: NI KAIZAO
2 granted patents·0 citations·filing 2020–2021
20Inventor score
Files withSHANGHAI INST OPTICS & FINE MECH CAS2
Top patents by PatentIndex Score
2 records- 0148US11175220B2Surface defect measuring apparatus and method by microscopic scattering polarization imagingSHANGHAI INST OPTICS & FINE MECH CAS·Filed 2020·Granted Nov 16, 2021·0 cites·2 claims
- 0242US12099002B2Single-beam photothermal measurement apparatus and measurement method for absorptive defectsSHANGHAI INST OPTICS & FINE MECH CAS·Filed 2021·Granted Sep 24, 2024·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →