Inventor · disambiguated record
Kazuyuki Nishizawa
Also filed as: NISHIZAWA KAZUYUKI
11 granted patents·105 citations·filing 1993–2009
88Inventor score
Top patents by PatentIndex Score
11 records- 0188US7700944B2Semiconductor wafer, semiconductor chip, and semiconductor chip inspection methodNEC ELECTRONICS CORP·Filed 2005·Granted Apr 20, 2010·23 cites·6 claims
- 0268US7463547B2Micro computer and method of optimizing microcomputerNEC ELECTRONICS CORP·Filed 2006·Granted Dec 9, 2008·5 cites·19 claims
- 0365US7710138B2Semiconductor chip and semiconductor device including the sameNEC ELECTRONICS CORP·Filed 2009·Granted May 4, 2010·3 cites·11 claims
- 0464US5845446ALongitudinal facing, facing retainers, and facing structure having facing and facing retainersGANTAN BEAUTY KOGYO KK·Filed 1996·Granted Dec 8, 1998·39 cites·26 claims
- 0562US7557646B2Semiconductor device with non-intersecting power and ground wiring patternsNEC ELECTRONICS CORP·Filed 2006·Granted Jul 7, 2009·3 cites·8 claims
- 0661US7492036B2Semiconductor chip and semiconductor device including the sameNEC ELECTRONICS CORP·Filed 2006·Granted Feb 17, 2009·2 cites·17 claims
- 0760US7521918B2Microcomputer chip with function capable of supporting emulationNEC ELECTRONICS CORP·Filed 2005·Granted Apr 21, 2009·1 cites·5 claims
- 0858US7612419B2Wafer, semiconductor chip, and semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Nov 3, 2009·1 cites·5 claims
- 0951US5507001AMicrocomputer including CPU and serial data communication unit operating in synchronismNEC CORP·Filed 1994·Granted Apr 9, 1996·26 cites·3 claims
- 1048US7564255B2Semiconductor integrated circuit for reducing number of contact pads to be probed in probe testNEC ELECTRONICS CORP·Filed 2006·Granted Jul 21, 2009·2 cites·10 claims
- 1128US5412403AVideo display control circuitNEC CORP·Filed 1993·Granted May 2, 1995·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →