Inventor · disambiguated record
Kazuhiro Ohkubo
Also filed as: OHKUBO KAZUHIRO
3 granted patents·1 pending application·9 citations·filing 2003–2022
59Inventor score
Top patents by PatentIndex Score
4 records- 0157US8409349B2Film thickness measurement method, epitaxial wafer production process and epitaxial waferOHKUBO KAZUHIRO·Filed 2009·Granted Apr 2, 2013·3 cites·8 claims
- 0248US6892037B2Image forming apparatus, control system therefor, cartridge, and memory device mounted in cartridgeCANON KK·Filed 2003·Granted May 10, 2005·6 cites·26 claims
- 0343US2024258126A1Semiconductor wafer cleaning device, semiconductor wafer cleaning method, and method for manufacturing silicon waferSUMCO CORP·Filed 2022·Application pending·0 cites
- 0436US12205830B2Cleaning apparatus for semiconductor wafer and method of cleaning semiconductor waferSUMCO CORP·Filed 2020·Granted Jan 21, 2025·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →