Inventor · disambiguated record
Kazuki Ohno
Also filed as: OHNO KAZUKI
8 granted patents·3 pending applications·135 citations·filing 1991–2024
88Inventor score
Top patents by PatentIndex Score
11 records- 0172US6400623B2Semiconductor memory having parallel test modeNEC CORP·Filed 2001·Granted Jun 4, 2002·21 cites·20 claims
- 0269US5255226ASemiconductor memory device with a redundancy circuit bypassing failed memory cellsNEC CORP·Filed 1991·Granted Oct 19, 1993·38 cites·14 claims
- 0368US6147549AReference voltage generating circuit of generating a plurality of reference voltagesNEC CORP·Filed 1998·Granted Nov 14, 2000·25 cites·2 claims
- 0463US6104664AMemory address generator circuit and semiconductor memory deviceNEC CORP·Filed 1999·Granted Aug 15, 2000·23 cites·20 claims
- 0559US2024363950A1Battery caseHONDA MOTOR CO LTD·Filed 2023·Application pending·0 cites
- 0659US2024363986A1Battery caseHONDA MOTOR CO LTD·Filed 2023·Application pending·0 cites
- 0755US2025304231A1Electric outboard motorHONDA MOTOR CO LTD·Filed 2024·Application pending·0 cites
- 0852US6073219ASemiconductor memory device with high speed read-modify-write functionNEC CORP·Filed 1997·Granted Jun 6, 2000·15 cites·4 claims
- 0950US6337598B1Reference voltage generating device and generating method of the sameNEC CORP·Filed 2000·Granted Jan 8, 2002·7 cites·8 claims
- 1032US5704059AMethod of write to graphic memory where memory cells designated by plurality of addresses selected simultaneously for one row address are writtenNEC CORP·Filed 1996·Granted Dec 30, 1997·3 cites·3 claims
- 1132US5654934ASemiconductor memory employing a block-write systemNEC CORP·Filed 1996·Granted Aug 5, 1997·3 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →