Inventor · disambiguated record
Kang-Tai Peng
Also filed as: PENG KANG-TAI
3 granted patents·2 pending applications·0 citations·filing 2016–2025
45Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD5
Top patents by PatentIndex Score
5 records- 0171US2025323105A1Test structure and integrated circuit test using sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0266US12387984B2Test structure and integrated circuit test using sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 12, 2025·0 cites·20 claims
- 0357US10866276B2Method and system for aligning probe card in semiconductor device testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 15, 2020·0 cites·20 claims
- 0451US2024312980A1Semiconductor structure and method of manufactureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0548US10509071B2Method and system for aligning probe card in semiconductor device testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 17, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →