Inventor · disambiguated record
Kartik Ramanujachar
Also filed as: RAMANUJACHAR KARTIK
4 granted patents·5 citations·filing 2003–2022
61Inventor score
Top patents by PatentIndex Score
4 records- 0152US11804413B1Product design for test to enable electrical non-destructive test for measuring multi-chip interconnect defectsINTEL CORP·Filed 2022·Granted Oct 31, 2023·0 cites·20 claims
- 0246US7130749B2Wavelet analysis of signals to determine characteristics of anomalies in a wireTEXAS INSTRUMENTS INC·Filed 2003·Granted Oct 31, 2006·1 cites·15 claims
- 0341US6950761B2Wavelet analysis of one or more acoustic signals to identify one or more anomalies in an objectTEXAS INSTRUMENTS INC·Filed 2003·Granted Sep 27, 2005·4 cites·19 claims
- 0428US7313490B2Wavelet analysis of one or more time domain reflectometry (TDR) signals to determine one or more characteristics of one or more anomalies in a wireTEXAS INSTRUMENTS INC·Filed 2003·Granted Dec 25, 2007·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →