Inventor · disambiguated record
Kazuhiro Sakaguchi
Also filed as: SAKAGUCHI KAZUHIRO
21 granted patents·3 pending applications·275 citations·filing 1995–2021
95Inventor score
Top patents by PatentIndex Score
24 records- 0184US7970817B2Information processing device, information processing method, and control programCANON KK·Filed 2005·Granted Jun 28, 2011·14 cites·8 claims
- 0278US6766485B1Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control programNEC ELECTRONICS CORP·Filed 2000·Granted Jul 20, 2004·22 cites·9 claims
- 0378US5801540AElectronic circuit tester and method of testing electronic circuitNEC CORP·Filed 1997·Granted Sep 1, 1998·37 cites·6 claims
- 0477US6205559B1Method and apparatus for diagnosing failure occurrence positionNEC CORP·Filed 1998·Granted Mar 20, 2001·42 cites·33 claims
- 0574US5790565ACMOS integrated circuit failure diagnosis apparatus and diagnostic methodNEC CORP·Filed 1997·Granted Aug 4, 1998·38 cites·37 claims
- 0672US5949798AIntegrated circuit fault testing system based on power spectrum analysis of power supply currentNEC CORP·Filed 1997·Granted Sep 7, 1999·34 cites·19 claims
- 0769US6058502ADiagnostic system analyzing frequency spectrum of electric power for diagnosing integrated circuit, method and information storage medium storing computer program for the methodNEC CORP·Filed 1998·Granted May 2, 2000·30 cites·47 claims
- 0866US7483799B2Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program thereforNEC CORP·Filed 2005·Granted Jan 27, 2009·4 cites·6 claims
- 0965US11714106B2Test apparatus, test method and recording mediumRENESAS ELECTRONICS CORP·Filed 2021·Granted Aug 1, 2023·0 cites·12 claims
- 1061US6351835B1High speed LSI spectral analysis testing apparatus and methodNEC CORP·Filed 1999·Granted Feb 26, 2002·23 cites·16 claims
- 1160US6996489B2Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program thereforNEC ELECTRONICS CORP·Filed 2001·Granted Feb 7, 2006·8 cites·29 claims
- 1251US8011011B2Method and apparatus for processing dataCANON KK·Filed 2004·Granted Aug 30, 2011·2 cites·5 claims
- 1349US6510289B2Image formation system, control method of image formation system, image formation apparatus and storage medium thereofCANON KK·Filed 2001·Granted Jan 21, 2003·4 cites·29 claims
- 1448US5659244AElectronic circuit tester and method of testing electronic circuitNEC CORP·Filed 1995·Granted Aug 19, 1997·12 cites·3 claims
- 1546US6684170B2Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the sameNEC CORP·Filed 2002·Granted Jan 27, 2004·2 cites·16 claims
- 1643US6973395B2Observation and/or failure inspection apparatus, method and program thereforNEC ELECTRONICS CORP·Filed 2003·Granted Dec 6, 2005·2 cites·20 claims
- 1743US6704675B1Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the sameNEC CORP·Filed 2000·Granted Mar 9, 2004·1 cites·20 claims
- 1842US2006059093A1Data processing apparatus, data processing method, and computer programCANON KK·Filed 2005·Application pending·0 cites
- 1941US2013103328A1Screening device for semiconductor devices, screening method for semiconductor devices and program thereofRENESAS ELECTRONICS CORP·Filed 2012·Application pending·0 cites
- 2038US6931336B2Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the sameNEC CORP·Filed 2002·Granted Aug 16, 2005·0 cites·30 claims
- 2138US6694274B2Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the sameNEC CORP·Filed 2002·Granted Feb 17, 2004·0 cites·16 claims
- 2238US2011172941A1Screening apparatus, screening method, and programRENESAS ELECTRONICS CORP·Filed 2011·Application pending·0 cites
- 2337US8878561B2Screening method, screening device and programSAKAGUCHI KAZUHIRO·Filed 2012·Granted Nov 4, 2014·0 cites·13 claims
- 2435US6480011B2Screening of semiconductor integrated circuit devicesNEC CORP·Filed 2001·Granted Nov 12, 2002·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →