Inventor · disambiguated record
Kazuhiro Segawa
Also filed as: SEGAWA KAZUHIRO
19 granted patents·2 pending applications·236 citations·filing 1992–2022
93Inventor score
Top patents by PatentIndex Score
21 records- 0194US9625831B1Exposure apparatus, exposure method and manufacturing method of semiconductor deviceTOSHIBA KK·Filed 2016·Granted Apr 18, 2017·12 cites·20 claims
- 0294US8328524B2Air compressor and method for controlling the sameIIMURA YOSHIO·Filed 2009·Granted Dec 11, 2012·40 cites·23 claims
- 0392US7704052B2Air compressor and method for controlling the sameHITACHI KOKI KK·Filed 2004·Granted Apr 27, 2010·45 cites·6 claims
- 0491US7641449B2Air compressor having a controller for a variable speed motor and a compressed air tankHITACHI KOKI KK·Filed 2004·Granted Jan 5, 2010·46 cites·13 claims
- 0588USD343345SPortable electric hammerHITACHI KOKI KK·Filed 1992·Granted Jan 18, 1994·36 cites·1 claims
- 0678US8821131B2Air compressorYOKOTA TOMOYOSHI·Filed 2009·Granted Sep 2, 2014·6 cites·17 claims
- 0776US7017342B2Air compressor and control method thereforHITACHI KOKI KK·Filed 2004·Granted Mar 28, 2006·15 cites·10 claims
- 0868US9952505B2Imprint device and pattern forming methodTOSHIBA MEMORY CORP·Filed 2014·Granted Apr 24, 2018·1 cites·7 claims
- 0966US12353123B2Semiconductor manufacturing apparatus and semiconductor manufacturing method thereofWINBOND ELECTRONICS CORP·Filed 2022·Granted Jul 8, 2025·0 cites·12 claims
- 1063US9929103B2Misalignment checking device and manufacturing method of semiconductor deviceTOSHIBA MEMORY CORP·Filed 2015·Granted Mar 27, 2018·1 cites·2 claims
- 1161US6597677B1Spreading code allocation method and systemNEC CORP·Filed 1999·Granted Jul 22, 2003·28 cites·15 claims
- 1260US7326038B2Pressure switch mechanism and air compressor using the same mechanismHITACHI KOKI KK·Filed 2004·Granted Feb 5, 2008·6 cites·17 claims
- 1352US12372953B2Dynamic sampling method and device for semiconductor manufactureWINBOND ELECTRONICS CORP·Filed 2022·Granted Jul 29, 2025·0 cites·18 claims
- 1449US9396299B2Reticle mark arrangement method and nontransitory computer readable medium storing a reticle mark arrangement programTOSHIBA KK·Filed 2014·Granted Jul 19, 2016·0 cites·18 claims
- 1549US9239526B2Exposure apparatus and transfer characteristics measuring methodTOSHIBA KK·Filed 2013·Granted Jan 19, 2016·0 cites·10 claims
- 1646US10269661B2Manufacturing system for semiconductor device, method of manufacturing semiconductor device, and control deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Apr 23, 2019·0 cites·20 claims
- 1745US2016020099A1Pattern forming method and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1844US11016391B2Light-exposure method, light-exposure control unit, and semiconductor device manufacturing methodTOSHIBA MEMORY CORP·Filed 2019·Granted May 25, 2021·0 cites·13 claims
- 1944US2015371946A1Semiconductor device and method for manufacturing samePS4 LUXCO SARL·Filed 2014·Application pending·0 cites
- 2040US10054856B2Exposure method, manufacturing method of device, and thin film sheetTOSHIBA MEMORY CORP·Filed 2015·Granted Aug 21, 2018·0 cites·11 claims
- 2137US9941177B2Pattern accuracy detecting apparatus and processing systemTOSHIBA MEMORY CORP·Filed 2016·Granted Apr 10, 2018·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →