Inventor · disambiguated record
Katsuya Shiga
Also filed as: SHIGA KATSUYA
3 granted patents·80 citations·filing 1998–2000
74Inventor score
Files withMITSUBISHI ELECTRIC CORP3
Top patents by PatentIndex Score
3 records- 0182US6127837AMethod of testing semiconductor devicesMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Oct 3, 2000·50 cites·6 claims
- 0261US6339229B1Test structure for insulation-film evaluationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 15, 2002·9 cites·17 claims
- 0361US6037794ASemiconductor device testing apparatus and testing method thereofMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 14, 2000·21 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →