Inventor · disambiguated record
Kazufumi Shiozawa
Also filed as: SHIOZAWA KAZUFUMI
7 granted patents·5 pending applications·66 citations·filing 2010–2025
79Inventor score
Top patents by PatentIndex Score
12 records- 0193US8759929B2Solid-state imaging deviceSHIOZAWA KAZUFUMI·Filed 2010·Granted Jun 24, 2014·56 cites·14 claims
- 0283US8461659B2Solid state imaging apparatusKOKUBUN KOICHI·Filed 2011·Granted Jun 11, 2013·4 cites·18 claims
- 0376US8546178B2Semiconductor light emitting device and method for manufacturing semiconductor light emitting deviceMORIOKA TOMOKO·Filed 2011·Granted Oct 1, 2013·4 cites·13 claims
- 0474US8242532B2Semiconductor light-emitting deviceSATO TAISUKE·Filed 2010·Granted Aug 14, 2012·2 cites·6 claims
- 0556US2024250096A1Pixel structure with improved photoelectric conversion efficiency in optically sensitive materialPIXART IMAGING INC·Filed 2023·Application pending·0 cites
- 0655US11526975B2Method for displaying index values in generation of mask pattern verification modelKIOXIA CORP·Filed 2019·Granted Dec 13, 2022·0 cites·19 claims
- 0754US2025287718A1Solid-state image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0851US2025287712A1Solid-state imaging deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0947US9368413B2Light exposure condition analysis method, nontransitory computer readable medium storing a light exposure condition analysis program, and manufacturing method for a semiconductor deviceTOSHIBA KK·Filed 2014·Granted Jun 14, 2016·0 cites·9 claims
- 1047US2011308612A1Thin film solar cell and method for manufacturing the sameSHIOZAWA KAZUFUMI·Filed 2011·Application pending·0 cites
- 1143US2015253680A1Method of calculating amount of aberration and method of calculating amount of misalignmentTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1231US9760017B2Wafer lithography equipmentTOSHIBA MEMORY CORP·Filed 2015·Granted Sep 12, 2017·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →