Inventor · disambiguated record
Kazumasa Sunouchi
Also filed as: SUNOUCHI KAZUMASA
31 granted patents·849 citations·filing 1988–2023
97Inventor score
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31 records- 0197US6632723B2Semiconductor deviceTOSHIBA KK·Filed 2002·Granted Oct 14, 2003·191 cites·29 claims
- 0293US10707269B2Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Jul 7, 2020·5 cites·19 claims
- 0393US6258650B1Method for manufacturing semiconductor memory deviceTOSHIBA KK·Filed 1999·Granted Jul 10, 2001·99 cites·17 claims
- 0491US10985209B2Nonvolatile storage deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Apr 20, 2021·3 cites·10 claims
- 0589US6590244B2Semiconductor memory device using magneto resistive effect elementTOSHIBA KK·Filed 2002·Granted Jul 8, 2003·49 cites·20 claims
- 0688US5248628AMethod of fabricating a semiconductor memory deviceTOSHIBA KK·Filed 1992·Granted Sep 28, 1993·69 cites·12 claims
- 0780US5363325ADynamic semiconductor memory device having high integration densityTOSHIBA KK·Filed 1992·Granted Nov 8, 1994·46 cites·17 claims
- 0878US6153476ASemiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 1998·Granted Nov 28, 2000·49 cites·29 claims
- 0977US11856791B2Nonvolatile storage deviceKIOXIA CORP·Filed 2022·Granted Dec 26, 2023·0 cites·10 claims
- 1074US5049957AMOS type dynamic random access memoryTOSHIBA KK·Filed 1990·Granted Sep 17, 1991·32 cites·11 claims
- 1172US6980463B2Semiconductor memory device including memory cell portion and peripheral circuit portionTOSHIBA KK·Filed 2002·Granted Dec 27, 2005·17 cites·22 claims
- 1271US11367748B2Nonvolatile storage deviceKIOXIA CORP·Filed 2021·Granted Jun 21, 2022·0 cites·8 claims
- 1371US5144579ASemiconductor memory device and its fabricating methodTOSHIBA KK·Filed 1990·Granted Sep 1, 1992·31 cites·9 claims
- 1470US5559350ADynamic RAM and method of manufacturing the sameTOSHIBA KK·Filed 1994·Granted Sep 24, 1996·33 cites·17 claims
- 1569US6025623ASemiconductor device with high integration density and improved performanceTOSHIBA KK·Filed 1997·Granted Feb 15, 2000·22 cites·5 claims
- 1668US6204527B1Semiconductor memory device and method for producing sameTOSHIBA KK·Filed 1998·Granted Mar 20, 2001·28 cites·14 claims
- 1766US6294422B1Semiconductor device with high integration density and improved performanceTOSHIBA KK·Filed 1999·Granted Sep 25, 2001·19 cites·12 claims
- 1864US5043298AProcess for manufacturing a DRAM cellTOSHIBA KK·Filed 1990·Granted Aug 27, 1991·23 cites·14 claims
- 1963US6078073ASemiconductor apparatus formed by SAC (self-aligned contact) method and manufacturing method thereforTOSHIBA KK·Filed 1997·Granted Jun 20, 2000·27 cites·7 claims
- 2063US6031260ASemiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 1996·Granted Feb 29, 2000·20 cites·9 claims
- 2163US5106774AMethod of making trench type dynamic random access memory deviceTOSHIBA KK·Filed 1991·Granted Apr 21, 1992·22 cites·13 claims
- 2259US6300178B1Semiconductor device with self-aligned contact and manufacturing method thereofTOSHIBA KK·Filed 1998·Granted Oct 9, 2001·24 cites·30 claims
- 2355US6483138B1Semiconductor apparatus formed by SAC (self-aligned contact)TOSHIBA KK·Filed 2000·Granted Nov 19, 2002·8 cites·4 claims
- 2452US12236990B2Magnetic memory deviceKIOXIA CORP·Filed 2023·Granted Feb 25, 2025·0 cites·20 claims
- 2552US11742020B2Storage deviceKIOXIA CORP·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 2646US10985210B2Nonvolatile storage deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Apr 20, 2021·0 cites·20 claims
- 2746US4897702ASemiconductor memory device and manufacturing method for the sameTOSHIBA KK·Filed 1988·Granted Jan 30, 1990·9 cites·3 claims
- 2845US11676661B2Storage deviceKIOXIA CORP·Filed 2021·Granted Jun 13, 2023·0 cites·20 claims
- 2945US5488242ASemiconductor memory deviceTOSHIBA KK·Filed 1993·Granted Jan 30, 1996·13 cites·11 claims
- 3042US5164801AA p channel mis type semiconductor deviceTOSHIBA KK·Filed 1991·Granted Nov 17, 1992·10 cites·17 claims
- 3140US9728242B1Memory deviceTOSHIBA KK·Filed 2016·Granted Aug 8, 2017·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →