Inventor · disambiguated record
Kazuo Taguchi
Also filed as: TAGUCHI KAZUO
26 granted patents·2 pending applications·388 citations·filing 1983–2009
96Inventor score
Top patents by PatentIndex Score
28 records- 0181US5160598AOxygen sensor for air-fuel ratio control having a protective layer including an oxygen storage materialNGK SPARK PLUG CO·Filed 1990·Granted Nov 3, 1992·48 cites·38 claims
- 0279US4945009AElectroluminescence deviceHITACHI LTD·Filed 1988·Granted Jul 31, 1990·35 cites·31 claims
- 0379US4668477AGas sensorNGK SPARK PLUG CO·Filed 1984·Granted May 26, 1987·37 cites·10 claims
- 0477US5849165AOxygen sensor for preventing silicon poisoningNGK SPARK PLUG CO·Filed 1995·Granted Dec 15, 1998·48 cites·17 claims
- 0572US4877994AElectroluminescent device and process for producing the sameHITACHI LTD·Filed 1988·Granted Oct 31, 1989·25 cites·19 claims
- 0671US6962632B2Aluminum alloy hollow material, aluminum alloy extruded pipe material for air conditioner piping and process for producing the sameFURUKAWA SKY ALUMINUM CORP·Filed 2004·Granted Nov 8, 2005·5 cites·6 claims
- 0771US6908520B2Aluminum alloy hollow material, aluminum alloy extruded pipe material for air conditioner piping and process for producing the sameFURUKAWA ELECTRIC CO LTD·Filed 2001·Granted Jun 21, 2005·5 cites·17 claims
- 0869US5326597AMethod of producing oxygen sensor for air-fuel ratio control having a protective layer including oxygen storage materialNGK SPARK PLUG CO·Filed 1992·Granted Jul 5, 1994·28 cites·40 claims
- 0968US4857802AThin film EL element and process for producing the sameHITACHI LTD·Filed 1987·Granted Aug 15, 1989·24 cites·10 claims
- 1067US4982675AProfile stitcherJUKI KK·Filed 1988·Granted Jan 8, 1991·9 cites·1 claims
- 1166US6327891B1Gas sensorNGK SPARK PLUG CO·Filed 1999·Granted Dec 11, 2001·30 cites·5 claims
- 1256US6550309B1Gas sensor with multiple mechanical and thermal shock cushion layersNGK SPARK PLUG CO·Filed 1998·Granted Apr 22, 2003·20 cites·2 claims
- 1355US5200277AElectroluminescent deviceHITACHI LTD·Filed 1989·Granted Apr 6, 1993·14 cites·11 claims
- 1452US8454766B2Extruded material of a free-cutting aluminum alloy excellent in embrittlement resistance at a high temperatureMORI KENSUKE·Filed 2008·Granted Jun 4, 2013·0 cites·8 claims
- 1552US6418777B1Gas sensorNGK SPARK PLUG CO·Filed 1998·Granted Jul 16, 2002·16 cites·9 claims
- 1651US7262993B2Nonvolatile semiconductor memory deviceSEIKO EPSON CORP·Filed 2006·Granted Aug 28, 2007·2 cites·15 claims
- 1749US7211555B2Process for preparing fine zeolite particlesKAO CORP·Filed 2004·Granted May 1, 2007·0 cites·11 claims
- 1847US5099172AThin film electroluminescent deviceHITACHI LTD·Filed 1988·Granted Mar 24, 1992·9 cites·12 claims
- 1947US4507191AOxygen sensor with heaterNGK SPARK PLUG CO·Filed 1983·Granted Mar 26, 1985·11 cites·2 claims
- 2046US5182491AThin film electroluminescent deviceHITACHI LTD·Filed 1992·Granted Jan 26, 1993·10 cites·11 claims
- 2145US8040728B2Semiconductor integrated circuitSEIKO EPSON CORP·Filed 2009·Granted Oct 18, 2011·0 cites·5 claims
- 2245US7279749B2Semiconductor device and semiconductor memory using the sameSEIKO EPSON CORP·Filed 2004·Granted Oct 9, 2007·2 cites·19 claims
- 2344US6831056B1Process for preparing fine alkaline earth metal zeolite particlesKAO CORP·Filed 2000·Granted Dec 14, 2004·0 cites·16 claims
- 2439US2004146701A1Semiconductor substrate having SOI structure and manufacturing method and semiconductor device thereofTAGUCHI KAZUO·Filed 2003·Application pending·0 cites
- 2538US4586458ACoating apparatus for scratches of glass bottleASAHI BREWERIES LTD·Filed 1985·Granted May 6, 1986·10 cites·4 claims
- 2637US7098698B2Semiconductor integrated circuit device and sense amplifier of memorySEIKO EPSON CORP·Filed 2004·Granted Aug 29, 2006·0 cites·14 claims
- 2736US2005082613A1Semiconductor integrated circuit device and semiconductor memory using the sameSEIKO EPSON CORP·Filed 2004·Application pending·0 cites
- 2835US7319627B2Memory deviceSEIKO EPSON CORP·Filed 2006·Granted Jan 15, 2008·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →