Inventor · disambiguated record
Kaname Takahashi
Also filed as: TAKAHASHI KANAME
7 granted patents·3 pending applications·82 citations·filing 1999–2012
83Inventor score
Top patents by PatentIndex Score
10 records- 0186US6403968B1Scanning electron microscopeHITACHI LTD·Filed 1999·Granted Jun 11, 2002·55 cites·11 claims
- 0276US6963069B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2004·Granted Nov 8, 2005·11 cites·20 claims
- 0375US8907303B2Stage device and control method for stage deviceMOMOI YASUYUKI·Filed 2012·Granted Dec 9, 2014·4 cites·20 claims
- 0474US7456403B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2005·Granted Nov 25, 2008·3 cites·2 claims
- 0565US8969828B2Scanning electron microscope with a table being guided by rolling friction elementsSAKAMOTO NAOKI·Filed 2011·Granted Mar 3, 2015·2 cites·6 claims
- 0659US7964845B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 21, 2011·0 cites·7 claims
- 0758US7891482B2Work carrier apparatus in assembly lineHONDA MOTOR CO LTD·Filed 2006·Granted Feb 22, 2011·7 cites·15 claims
- 0838US2013082190A1Stage apparatusMOMOI YASUYUKI·Filed 2011·Application pending·0 cites
- 0937US2013056636A1Scanning electron microscopeHANEDA SHIGERU·Filed 2011·Application pending·0 cites
- 1037US2009060693A1Working Device and Working Method with RobotHONDA MOTOR CO LTD·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →