Inventor · disambiguated record
Kazuma Takenaka
Also filed as: TAKENAKA KAZUMA
16 granted patents·9 pending applications·16 citations·filing 2002–2025
87Inventor score
Top patents by PatentIndex Score
25 records- 0183US9171965B2Force detection device, and force transducer deviceYOKOGAWA ELECTRIC CORP·Filed 2014·Granted Oct 27, 2015·7 cites·10 claims
- 0279US10613120B2Current measurement deviceYOKOGAWA ELECTRIC CORP·Filed 2017·Granted Apr 7, 2020·2 cites·13 claims
- 0376US2025180607A1Current measurement deviceYOKOGAWA ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 0469US12253544B2Current measurement deviceYOKOGAWA ELECTRIC CORP·Filed 2021·Granted Mar 18, 2025·0 cites·12 claims
- 0569US11003178B2Facility diagnosis device, facility diagnosis method, and facility diagnosis programYOKOGAWA ELECTRIC CORP·Filed 2017·Granted May 11, 2021·1 cites·13 claims
- 0669US9267913B2PH sensor, pH measurement method, ion sensor, and ion concentration measurement methodYOKOGAWA ELECTRIC CORP·Filed 2014·Granted Feb 23, 2016·1 cites·15 claims
- 0768US8809916B2pH sensor, pH measurement method, ion sensor, and ion concentration measurement methodSHINTANI YUKIHIRO·Filed 2012·Granted Aug 19, 2014·2 cites·9 claims
- 0864US11486943B2Magnetism detection device and magnetism detection methodYOKOGAWA ELECTRIC CORP·Filed 2021·Granted Nov 1, 2022·0 cites·12 claims
- 0964US2025264555A1Measurement device and estimation systemYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1062US11959981B2Magnetic detector, transmission line and magnetic detection methodYOKOGAWA ELECTRIC CORP·Filed 2019·Granted Apr 16, 2024·0 cites·14 claims
- 1158US11959851B2Pipeline thickness measurement sensor deviceYOKOGAWA ELECTRIC CORP·Filed 2019·Granted Apr 16, 2024·0 cites·17 claims
- 1258US2025209473A1Information processing apparatus, evaluation method, and computer readable recording mediumYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1358US2025296464A1Information processing apparatus, update method, and computer readable recording mediumYOKOGAWA ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 1457US12366613B2Magnetic detection apparatus, magnetic sensor, and magnetic detection methodYOKOGAWA ELECTRIC CORP·Filed 2023·Granted Jul 22, 2025·0 cites·8 claims
- 1557US11927647B2Current measurement device, current measurement method, and non-transitory computer readable storage mediumYOKOGAWA ELECTRIC CORP·Filed 2020·Granted Mar 12, 2024·0 cites·20 claims
- 1657US2024337711A1Battery identification system, battery identification method, and non-transitory computer readable mediumYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1757US2024356340A1Battery identification device, battery identification method, and storage mediumYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1856US11360124B2Current measuring device, current measuring method, and non-transitory computer-readable storage mediumYOKOGAWA ELECTRIC CORP·Filed 2019·Granted Jun 14, 2022·0 cites·10 claims
- 1956US6791909B2Optical disc reproducing apparatusDENON LTD·Filed 2002·Granted Sep 14, 2004·3 cites·8 claims
- 2056US2024353371A1Battery identification device, battery identification method, and storage mediumYOKOGAWA ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 2151US11988691B2Current measurement device, current measurement method, and non-transitory computer readable storage mediumYOKOGAWA ELECTRIC CORP·Filed 2020·Granted May 21, 2024·0 cites·20 claims
- 2250US9459293B2Current sensorYOKOGAWA ELECTRIC CORP·Filed 2014·Granted Oct 4, 2016·0 cites·13 claims
- 2344US2015145509A1Conductive foreign material detecting apparatusYOKOGAWA ELECTRIC CORP·Filed 2014·Application pending·0 cites
- 2443US12066466B2Current measurement device for measuring currents flowing in mutually opposite directionsYOKOGAWA ELECTRIC CORP·Filed 2020·Granted Aug 20, 2024·0 cites·6 claims
- 2535US2012241822A1Semiconductor device, distortion gauge, pressure sensor, and method of manufacturing semiconductor deviceTAKENAKA KAZUMA·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →