Inventor · disambiguated record
Kazuhiro Takigawa
Also filed as: TAKIGAWA KAZUHIRO
13 granted patents·6 pending applications·25 citations·filing 2011–2025
86Inventor score
Top patents by PatentIndex Score
19 records- 0188US11824518B2Acoustic wave deviceMURATA MANUFACTURING CO·Filed 2021·Granted Nov 21, 2023·2 cites·18 claims
- 0288US10408750B2Void-arranged structure and measurement method using the sameMURATA MANUFACTURING CO·Filed 2015·Granted Sep 10, 2019·5 cites·5 claims
- 0388US8610071B2Method of measuring characteristics of specimen, and flat-plate periodic structureMURATA MANUFACTURING CO·Filed 2013·Granted Dec 17, 2013·8 cites·12 claims
- 0485US10840881B2Longitudinally coupled resonator acoustic wave filterMURATA MANUFACTURING CO·Filed 2019·Granted Nov 17, 2020·5 cites·12 claims
- 0580US8304732B2Method of measuring characteristics of specimen and flat-plate periodic structureKAMBA SEIJI·Filed 2012·Granted Nov 6, 2012·5 cites·18 claims
- 0670US2025239992A1Acoustic wave device and acoustic wave elementMURATA MANUFACTURING CO·Filed 2025·Application pending·0 cites
- 0764US11777471B2Acoustic wave device, high-frequency front end circuit, and communication deviceMURATA MANUFACTURING CO·Filed 2021·Granted Oct 3, 2023·0 cites·12 claims
- 0857US2024356523A1Acoustic wave deviceMURATA MANUFACTURING CO·Filed 2024·Application pending·0 cites
- 0953US11025221B2Acoustic wave device, high-frequency front end circuit, and communication deviceMURATA MANUFACTURING CO·Filed 2019·Granted Jun 1, 2021·0 cites·20 claims
- 1051US12355425B2Acoustic wave deviceMURATA MANUFACTURING CO·Filed 2022·Granted Jul 8, 2025·0 cites·19 claims
- 1149US2014247452A1Periodic structure and measurement method using the sameMURATA MANUFACTURING CO·Filed 2014·Application pending·0 cites
- 1246US8269967B2Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring deviceKAMBA SEIJI·Filed 2011·Granted Sep 18, 2012·0 cites·21 claims
- 1345US9063078B2Method and apparatus for measuring characteristics of objectKONDO TAKASHI·Filed 2012·Granted Jun 23, 2015·0 cites·20 claims
- 1445US2013062524A1Method of measuring characteristics of specimen, and aperture array structure and measuring device used in sameMURATA MANUFACTURING CO·Filed 2012·Application pending·0 cites
- 1544US11018650B2Acoustic wave deviceMURATA MANUFACTURING CO·Filed 2019·Granted May 25, 2021·0 cites·19 claims
- 1644US2013011935A1Method of measuring characteristics of specimen and sensing device for use with the sameMURATA MANUFACTURING CO·Filed 2012·Application pending·0 cites
- 1743US2012126123A1Method of Measuring Characteristics of Specimen, Measuring Device, and Filter DeviceKONDO TAKASHI·Filed 2012·Application pending·0 cites
- 1842US9007578B2Method for measurement of properties of analyteTAKIGAWA KAZUHIRO·Filed 2012·Granted Apr 14, 2015·0 cites·8 claims
- 1941US11791798B2Acoustic wave deviceMURATA MANUFACTURING CO·Filed 2019·Granted Oct 17, 2023·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →