Inventor · disambiguated record
Kan Tan
Also filed as: TAN KAN
47 granted patents·35 pending applications·328 citations·filing 2002–2025
98Inventor score
Files withTEKTRONIX INC64TAN KAN10PICKERD JOHN J3DONGJIANG ENVIRONMENTAL COMPANY LTD1WARD BENJAMIN A1
Top patents by PatentIndex Score
82 records- 0196US11789051B2Real-equivalent-time oscilloscopeTEKTRONIX INC·Filed 2021·Granted Oct 17, 2023·3 cites·16 claims
- 0295US12442837B2Real-equivalent-time clock recovery for a nearly-real-time real-equivalent-time oscilloscopeTEKTRONIX INC·Filed 2022·Granted Oct 14, 2025·2 cites·18 claims
- 0394US12146914B2Bit error ratio estimation using machine learningTEKTRONIX INC·Filed 2022·Granted Nov 19, 2024·4 cites·19 claims
- 0492US8855186B2Methods and systems for providing optimum decision feedback equalization of high-speed serial data linksTAN KAN·Filed 2011·Granted Oct 7, 2014·26 cites·16 claims
- 0592US7474972B2Bandwidth multiplication for a test and measurement instrument using non-periodic functions for mixingTEKTRONIX INC·Filed 2007·Granted Jan 6, 2009·24 cites·24 claims
- 0691US9191245B2Methods and systems for providing optimum decision feedback equalization of high-speed serial data linksTEKTRONIX INC·Filed 2014·Granted Nov 17, 2015·16 cites·11 claims
- 0791US7460983B2Signal analysis system and calibration methodTEKTRONIX INC·Filed 2006·Granted Dec 2, 2008·30 cites·21 claims
- 0891US7414411B2Signal analysis system and calibration method for multiple signal probesTEKTRONIX INC·Filed 2006·Granted Aug 19, 2008·22 cites·16 claims
- 0991US7408363B2Signal analysis system and calibration method for processing acquires signal samples with an arbitrary loadTEKTRONIX INC·Filed 2006·Granted Aug 5, 2008·22 cites·18 claims
- 1090US8588703B2Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplicationTEKTRONIX INC·Filed 2013·Granted Nov 19, 2013·7 cites·10 claims
- 1189US10209276B2Jitter and eye contour at BER measurements after DFETEKTRONIX INC·Filed 2016·Granted Feb 19, 2019·8 cites·8 claims
- 1288US6832172B2Apparatus and method for spectrum analysis-based serial data jitter measurementTEKTRONIX INC·Filed 2002·Granted Dec 14, 2004·43 cites·13 claims
- 1387US6812688B2Signal acquisition method and apparatus using integrated phase locked loopTEKTRONIX INC·Filed 2002·Granted Nov 2, 2004·37 cites·7 claims
- 1486US10075286B1Equalizer for limited intersymbol interferenceTEKTRONIX INC·Filed 2017·Granted Sep 11, 2018·5 cites·20 claims
- 1586US7405575B2Signal analysis system and calibration method for measuring the impedance of a device under testTEKTRONIX INC·Filed 2006·Granted Jul 29, 2008·18 cites·23 claims
- 1684US11765002B2Explicit solution for DFE optimization with constraintsTEKTRONIX INC·Filed 2022·Granted Sep 19, 2023·1 cites·20 claims
- 1783US9130751B2Methods and systems for analyzing decomposed uncorrelated signal impairmentsZIVNY PAVEL R·Filed 2011·Granted Sep 8, 2015·11 cites·2 claims
- 1882US8374231B2Equalization simulator with training sequence detection for an oscilloscopeTEKTRONIX INC·Filed 2009·Granted Feb 12, 2013·10 cites·10 claims
- 1982US7206722B2Oscilloscope having an enhancement filterTEKTRONIX INC·Filed 2005·Granted Apr 17, 2007·11 cites·9 claims
- 2081US12449454B2Real-equivalent-time oscilloscopeTEKTRONIX INC·Filed 2023·Granted Oct 21, 2025·0 cites·16 claims
- 2181US10345339B2Group delay based averagingTEKTRONIX INC·Filed 2016·Granted Jul 9, 2019·2 cites·20 claims
- 2279US10862717B2Multirate data for S-parameter extractionTEKTRONIX INC·Filed 2020·Granted Dec 8, 2020·1 cites·20 claims
- 2378US11923895B2Optical transmitter tuning using machine learning and reference parametersTEKTRONIX INC·Filed 2022·Granted Mar 5, 2024·1 cites·20 claims
- 2476US10476704B2Equalizer for limited intersymbol interferenceTEKTRONIX INC·Filed 2018·Granted Nov 12, 2019·2 cites·14 claims
- 2573US2025370039A1Ai embedding vector data base calibration architectureTEKTRONIX INC·Filed 2025·Application pending·0 cites
- 2672US9294237B2Method for performing joint jitter and amplitude noise analysis on a real time oscilloscopeTEKTRONIX INC·Filed 2014·Granted Mar 22, 2016·3 cites·13 claims
- 2770US2025271468A1Apply oscilloscope noise compensation to acquired waveformTEKTRONIX INC·Filed 2025·Application pending·0 cites
- 2869US2025271500A1Entropy based software clock recovery for real-equivalent-time oscilloscopesTEKTRONIX INC·Filed 2025·Application pending·0 cites
- 2968US11898927B2Real-equivalent-time oscilloscope with time domain reflectometerTEKTRONIX INC·Filed 2022·Granted Feb 13, 2024·0 cites·20 claims
- 3067US10432434B2Multi-band noise reduction systems and methodsTEKTRONIX INC·Filed 2017·Granted Oct 1, 2019·2 cites·20 claims
- 3165US9596074B2Clock recovery for data signalsTEKTRONIX INC·Filed 2016·Granted Mar 14, 2017·1 cites·22 claims
- 3264US2024168471A1Interoperability predictor using machine learning and repository of tx, channel, and rx models from multiple vendorsTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 3364US2025102573A1System and method for decimated sweep measurements of a device under test using machine learningTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 3463US12301695B2Transmitter equalizer tap extractionTEKTRONIX INC·Filed 2023·Granted May 13, 2025·0 cites·20 claims
- 3563US2024169210A1Methods for 3d tensor builder for input to machine learningTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 3662US11940889B2Combined TDECQ measurement and transmitter tuning using machine learningTEKTRONIX INC·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 3762US11907090B2Machine learning for taps to accelerate TDECQ and other measurementsTEKTRONIX INC·Filed 2022·Granted Feb 20, 2024·0 cites·20 claims
- 3862US8233569B2Realtime spectrum trigger system on realtime oscilloscopeTAN KAN·Filed 2006·Granted Jul 31, 2012·4 cites·16 claims
- 3961US11598805B2Low frequency S-parameter measurementTEKTRONIX INC·Filed 2020·Granted Mar 7, 2023·0 cites·20 claims
- 4060US8463224B2Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplicationPICKERD JOHN J·Filed 2011·Granted Jun 11, 2013·1 cites·10 claims
- 4160US2025020713A1Margin tester measurement using machine learningTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 4258US12328242B2Eye classes separator with overlay, and composite, and dynamic eye-trigger for humans and machine learningTEKTRONIX INC·Filed 2022·Granted Jun 10, 2025·0 cites·18 claims
- 4358US6853933B2Method of identifying spectral impulses for Rj Dj separationTEKTRONIX INC·Filed 2003·Granted Feb 8, 2005·6 cites·7 claims
- 4458US2024125837A1Adaptive instrument noise removalTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 4558US2024393918A1User interface for a tensor builder to construct images for input to machine learningTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 4657US2024243779A1Automated channel characterization for machine-learning-based ris-aided mimo systemsTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 4756US2023408550A1Separating noise to increase machine learning prediction accuracy in a test and measurement systemTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 4856US2023408558A1Machine learning for measurement using linear response extracted from waveformTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 4955US10073750B2Serial data link measurement and simulation systemTEKTRONIX INC·Filed 2013·Granted Sep 11, 2018·1 cites·9 claims
- 5054US8000919B2Calibration of a partially symmetric fixtureTEKTRONIX INC·Filed 2008·Granted Aug 16, 2011·2 cites·4 claims
Showing the top 50 of 82 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →