Inventor · disambiguated record
Kay Chan Tong
Also filed as: TONG KAY C · TONG KAY CHAN
10 granted patents·1 pending application·26 citations·filing 1981–2019
82Inventor score
Top patents by PatentIndex Score
11 records- 0177US10114038B2Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 30, 2018·2 cites·25 claims
- 0265US11493535B2Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2019·Granted Nov 8, 2022·0 cites·20 claims
- 0355US10539592B2Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 21, 2020·0 cites·19 claims
- 0448US5427328ALaser beam rider guidance utilizing beam quadrature detectionNORTHROP GRUMMAN CORP·Filed 1985·Granted Jun 27, 1995·15 cites·14 claims
- 0543US11156638B2Contactors with signal pins, ground pins, and short ground pinsTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 26, 2021·0 cites·19 claims
- 0642US9698513B1Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Jul 4, 2017·0 cites·6 claims
- 0742US9673539B2Spring biased contact pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Jun 6, 2017·0 cites·7 claims
- 0841US4432511ABeam-rider guidance using two overlapping reticle discsNORTHROP CORP·Filed 1981·Granted Feb 21, 1984·9 cites·18 claims
- 0938US9755344B2Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Sep 5, 2017·0 cites·14 claims
- 1037US10126329B2Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Nov 13, 2018·0 cites·31 claims
- 1137US2013271172A1Probe apparatus and methodARMENDARIZ NORMAN J·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →