Inventor · disambiguated record
Katsumichi Ueyanagi
Also filed as: UEYANAGI KATSUMICHI
34 granted patents·7 pending applications·490 citations·filing 1994–2010
98Inventor score
Files withFUJI ELECTRIC CO LTD23FUJI ELEC DEVICE TECH CO LTD11FUJI ELECTRIC SYSTEMS CO LTD1KAMINAGA TOSHIAKI1YOKOMAE TOSHIYUKI1
Top patents by PatentIndex Score
41 records- 0193US5665915ASemiconductor capacitive acceleration sensorFUJI ELECTRIC CO LTD·Filed 1994·Granted Sep 9, 1997·89 cites·11 claims
- 0291US7370536B2Pressure sensor device and pressure sensor cell thereofFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Granted May 13, 2008·24 cites·29 claims
- 0385US8030749B2Semiconductor deviceFUJI ELECTRIC SYSTEMS CO LTD·Filed 2008·Granted Oct 4, 2011·12 cites·9 claims
- 0484US7705443B2Semiconductor device with lead frame including conductor plates arranged three-dimensionallyFUJI ELEC DEVICE TECH CO LTD·Filed 2007·Granted Apr 27, 2010·14 cites·19 claims
- 0583US7412894B2Pressure sensing device incorporating pressure sensing chip in resin caseFUJI ELEC DEVICE TECH CO LTD·Filed 2004·Granted Aug 19, 2008·37 cites·29 claims
- 0681US7274543B2Over-voltage protection circuitFUJI ELECTRIC CO LTD·Filed 2003·Granted Sep 25, 2007·29 cites·4 claims
- 0779US6332359B1Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 1999·Granted Dec 25, 2001·27 cites·18 claims
- 0877US7234358B2Pressure detecting apparatusFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Granted Jun 26, 2007·8 cites·8 claims
- 0976US5490421ASemi-conductor acceleration sensor having thin beam supported weightFUJI ELECTRIC CO LTD·Filed 1995·Granted Feb 13, 1996·39 cites·24 claims
- 1074US6494092B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Dec 17, 2002·10 cites·5 claims
- 1172US6747346B2Container for semiconductor sensor, manufacturing method therefor, and semiconductor sensor deviceFUJI ELECTRIC CO LTD·Filed 2002·Granted Jun 8, 2004·18 cites·50 claims
- 1271US6632697B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Oct 14, 2003·9 cites·12 claims
- 1369US7180798B2Semiconductor physical quantity sensing deviceFUJI ELECTRIC CO LTD·Filed 2003·Granted Feb 20, 2007·12 cites·21 claims
- 1469US6604430B2Pressure sensor and pressure sensor housing having a protective portionFUJI ELECTRIC CO LTD·Filed 2002·Granted Aug 12, 2003·14 cites·4 claims
- 1567US6962081B2Semiconductor physical quantity sensor with improved noise resistanceFUJI ELECTRIC CO LTD·Filed 2002·Granted Nov 8, 2005·14 cites·13 claims
- 1667US6526827B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Mar 4, 2003·7 cites·8 claims
- 1764US6446507B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted Sep 10, 2002·6 cites·4 claims
- 1864US5760290ASemiconductor acceleration sensor and testing method thereofFUJI ELECTRIC CO LTD·Filed 1995·Granted Jun 2, 1998·21 cites·12 claims
- 1963US7004035B2Physical value detecting apparatus and housing for physical value detecting meansFUJI ELEC DEVICE TECH CO LTD·Filed 2004·Granted Feb 28, 2006·11 cites·13 claims
- 2062US8304847B2Semiconductor pressure sensorKAMINAGA TOSHIAKI·Filed 2005·Granted Nov 6, 2012·4 cites·11 claims
- 2162US6346735B1Semiconductor sensor structure and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2000·Granted Feb 12, 2002·13 cites·10 claims
- 2260US7046013B2Open-circuit failure detection circuitFUJI ELECTRIC CO LTD·Filed 2003·Granted May 16, 2006·9 cites·18 claims
- 2358US7525389B2Signal amplifier circuit with a limiting voltage deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2007·Granted Apr 28, 2009·4 cites·11 claims
- 2454US7119657B2Polysilicon resistor semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2002·Granted Oct 10, 2006·6 cites·12 claims
- 2554US6680512B2Semiconductor device having an integral protection circuitFUJI ELECTRIC CO LTD·Filed 2002·Granted Jan 20, 2004·6 cites·18 claims
- 2653US5526687ASemiconductor acceleration sensor and testing method thereofFUJI ELECTRIC CO LTD·Filed 1994·Granted Jun 18, 1996·12 cites·8 claims
- 2751US5987921AMethod for making a semiconductor acceleration sensorFUJI ELECTRIC CO LTD·Filed 1998·Granted Nov 23, 1999·12 cites·4 claims
- 2850US6564634B2Semiconductor sensor chip and method for producing the chip, and semiconductor sensor and package for assembling the sensorFUJI ELECTRIC CO LTD·Filed 2001·Granted May 20, 2003·2 cites·7 claims
- 2948US5827967ASemiconductor accelerometer including strain gauges forming a wheatstone bridge and diffusion resistorsFUJI ELECTRIC CO LTD·Filed 1996·Granted Oct 27, 1998·12 cites·9 claims
- 3048US2006238186A1Semiconductor device and temperature detection method using the sameFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Application pending·0 cites
- 3145US7574919B2Integrated sensor including a pressure sensor and a temperature sensorFUJI ELEC DEVICE TECH CO LTD·Filed 2007·Granted Aug 18, 2009·0 cites·5 claims
- 3245US2006244101A1Semiconductor apparatus and physical quantity sensing apparatusFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Application pending·0 cites
- 3344US5608153ASemiconductor acceleration sensor and testing method thereofFUJI ELECTRIC CO LTD·Filed 1995·Granted Mar 4, 1997·9 cites·9 claims
- 3442US7571652B2Pressure sensor apparatus and pressure sensor housingFUJI ELEC DEVICE TECH CO LTD·Filed 2007·Granted Aug 11, 2009·0 cites·11 claims
- 3542US2010109647A1Physical quantity sensing apparatus having an internal circuit, a filter circuit having resistors, power supply, grounding, and output pads, with the length and width of wiring between the output or power supply pad and the internal circuit set so that the resistance of resistors and the parasitic resistance component of the wiring satisfy a certain relational expressionFUJI ELEC DEVICE TECH CO LTD·Filed 2010·Application pending·0 cites
- 3640US8779584B2Semiconductor apparatusYOKOMAE TOSHIYUKI·Filed 2007·Granted Jul 15, 2014·0 cites·14 claims
- 3737US6684371B2Layout of semiconductor integrated circuitFUJI ELECTRIC CO LTD·Filed 2002·Granted Jan 27, 2004·0 cites·1 claims
- 3837US2001040262A1Semiconductor sensor chip, method of manufacturing the same, and semiconductor sensor having the sameFiled 2001·Application pending·0 cites
- 3936US2002127822A1Semiconductor device and method of manufacturing the sameFiled 2002·Application pending·0 cites
- 4034US2002149984A1Semiconductor physical quantity sensing deviceFiled 2002·Application pending·0 cites
- 4134US2002186518A1Overvoltage protection circuitFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →