Inventor · disambiguated record
Kaneo Watanabe
Also filed as: WATANABE KANEO
15 granted patents·350 citations·filing 1986–2001
94Inventor score
Files withSANYO ELECTRIC CO15
Top patents by PatentIndex Score
15 records- 0187US4776894APhotovoltaic deviceSANYO ELECTRIC CO·Filed 1987·Granted Oct 11, 1988·62 cites·14 claims
- 0284US4922111ACard type image reader with means for relieving bending stressSANYO ELECTRIC CO·Filed 1988·Granted May 1, 1990·47 cites·9 claims
- 0384US4705912APhotovoltaic deviceSANYO ELECTRIC CO·Filed 1986·Granted Nov 10, 1987·50 cites·10 claims
- 0474US4719123AMethod for fabricating periodically multilayered filmSANYO ELECTRIC CO·Filed 1986·Granted Jan 12, 1988·42 cites·12 claims
- 0567US4922218APhotovoltaic deviceSANYO ELECTRIC CO·Filed 1988·Granted May 1, 1990·21 cites·25 claims
- 0664US4781765APhotovoltaic deviceSANYO ELECTRIC CO·Filed 1987·Granted Nov 1, 1988·19 cites·18 claims
- 0757US5085711APhotovoltaic deviceSANYO ELECTRIC CO·Filed 1990·Granted Feb 4, 1992·20 cites·19 claims
- 0857US4843451APhotovoltaic device with O and N dopingSANYO ELECTRIC CO·Filed 1988·Granted Jun 27, 1989·15 cites·8 claims
- 0956US5093703AThin film transistor with 10-15% hydrogen contentSANYO ELECTRIC CO·Filed 1989·Granted Mar 3, 1992·21 cites·5 claims
- 1051US5097338AScanning type image sensorSANYO ELECTRIC CO·Filed 1989·Granted Mar 17, 1992·10 cites·14 claims
- 1151US4831429ATransparent photo detector deviceSANYO ELECTRIC CO·Filed 1986·Granted May 16, 1989·12 cites·11 claims
- 1251US4755483AMethod for producing semiconductor device with p-type amorphous silicon carbide semiconductor film formed by photo-chemical vapor depositionSANYO ELECTRIC CO·Filed 1986·Granted Jul 5, 1988·13 cites·6 claims
- 1349US4857115APhotovoltaic deviceSANYO ELECTRIC CO·Filed 1988·Granted Aug 15, 1989·10 cites·11 claims
- 1442US7024513B2Controller and data processing systemSANYO ELECTRIC CO·Filed 2001·Granted Apr 4, 2006·0 cites·12 claims
- 1538US4799968APhotovoltaic deviceSANYO ELECTRIC CO·Filed 1987·Granted Jan 24, 1989·8 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →