Inventor · disambiguated record
Kaori Yaeshima
Also filed as: YAESHIMA KAORI
1 granted patent·2 pending applications·0 citations·filing 2012–2019
3Inventor score
Top patents by PatentIndex Score
3 records- 0145US10770260B2Defect observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 8, 2020·0 cites·14 claims
- 0232US2013134308A1Sample observation apparatus and method of markingHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 0328US2014084159A1Scanning electron microscope and method for preparing specimenYAESHIMA KAORI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →