Inventor · disambiguated record
Kazuki Yagi
Also filed as: YAGI KAZUKI
12 granted patents·2 pending applications·141 citations·filing 1999–2025
85Inventor score
Top patents by PatentIndex Score
14 records- 0190US11776787B2Charged particle beam apparatusJEOL LTD·Filed 2022·Granted Oct 3, 2023·2 cites·8 claims
- 0288US6163456AHybrid module and methods for manufacturing and mounting thereofTAIYO YUDEN KK·Filed 1999·Granted Dec 19, 2000·135 cites·35 claims
- 0372US10228342B2Solid electrolyte body and gas sensorDENSO CORP·Filed 2015·Granted Mar 12, 2019·1 cites·8 claims
- 0465US2025304826A1Polishing composition and polishing methodFUJIMI INC·Filed 2025·Application pending·0 cites
- 0563US9562446B2EngineMITSUBISHI MOTORS CORP·Filed 2014·Granted Feb 7, 2017·1 cites·22 claims
- 0662US10247131B2Cylinder head of engineMITSUBISHI MOTORS CORP·Filed 2014·Granted Apr 2, 2019·1 cites·11 claims
- 0760US9587529B2EngineMITSUBISHI MOTORS CORP·Filed 2014·Granted Mar 7, 2017·1 cites·6 claims
- 0860US2023176005A1Sensor control unitDENSO CORP·Filed 2023·Application pending·0 cites
- 0958US12500064B2Charged particle beam apparatus and control method for charged particle beam apparatusJEOL LTD·Filed 2023·Granted Dec 16, 2025·0 cites·6 claims
- 1058US12431319B2Charged particle beam device and image generation methodJEOL LTD·Filed 2022·Granted Sep 30, 2025·0 cites·6 claims
- 1154US11676796B2Charged particle beam deviceJEOL LTD·Filed 2021·Granted Jun 13, 2023·0 cites·8 claims
- 1253US11742176B2Transmission electron microscope and method of adjusting optical systemJEOL LTD·Filed 2021·Granted Aug 29, 2023·0 cites·6 claims
- 1347US10504690B2Sample holder and electron microscopeJEOL LTD·Filed 2018·Granted Dec 10, 2019·0 cites·6 claims
- 1439US10788443B2Gas sensor element and gas sensorDENSO CORP·Filed 2016·Granted Sep 29, 2020·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →