Inventor · disambiguated record
Kazuya Yamazaki
Also filed as: YAMAZAKI KAZUYA
14 granted patents·4 pending applications·84 citations·filing 1977–2021
89Inventor score
Files withJEOL LTD7MITSUBISHI MATERIALS CORP3YAMAZAKI KAZUYA3AMADA CO LTD1MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1
Top patents by PatentIndex Score
18 records- 0181US8772714B2Transmission electron microscope and method of observing TEM imagesJEOL LTD·Filed 2012·Granted Jul 8, 2014·5 cites·4 claims
- 0275US8657540B2Cutting insertYAMAZAKI KAZUYA·Filed 2012·Granted Feb 25, 2014·4 cites·6 claims
- 0375US8585330B2Cutting insertYAMAZAKI KAZUYA·Filed 2009·Granted Nov 19, 2013·9 cites·16 claims
- 0472US6312201B1Interference fit type cutting toolMITSUBISHI MATERIALS CORP·Filed 1999·Granted Nov 6, 2001·34 cites·12 claims
- 0567US8604445B2Method of evacuating sample holder, pumping system, and electron microscopeYAMAZAKI KAZUYA·Filed 2011·Granted Dec 10, 2013·2 cites·8 claims
- 0667US4144783AApparatus for blanking sheet materialsAMADA CO LTD·Filed 1977·Granted Mar 20, 1979·19 cites·5 claims
- 0753US2003182203A1Method for supporting shipment of virtual shopping mallFiled 2001·Application pending·0 cites
- 0852US11309161B2Charged particle beam apparatus and adjustment method for charged particle beam apparatusJEOL LTD·Filed 2021·Granted Apr 19, 2022·0 cites·3 claims
- 0950US2008219784A1Cutting insertMITSUBISHI MATERIALS CORP·Filed 2008·Application pending·0 cites
- 1047US6126365ABoring toolMITSUBISHI MATERIALS CORP·Filed 1999·Granted Oct 3, 2000·11 cites·3 claims
- 1146US11222764B2Charged particle beam device and control method of optical system of charged particle beam deviceJEOL LTD·Filed 2020·Granted Jan 11, 2022·0 cites·11 claims
- 1242US10020162B2Beam alignment method and electron microscopeJEOL LTD·Filed 2017·Granted Jul 10, 2018·0 cites·5 claims
- 1337US9773639B2Electron microscopeJEOL LTD·Filed 2016·Granted Sep 26, 2017·0 cites·5 claims
- 1437US2004059648A1Duplicate thermal invoice slipFiled 2001·Application pending·0 cites
- 1537US2004056475A1InvoiceFiled 2001·Application pending·0 cites
- 1636US10332720B2Charged particle system and method for measuring deflection fields in a sampleJEOL LTD·Filed 2016·Granted Jun 25, 2019·0 cites·9 claims
- 1735US9595416B2Transmission electron microscopeJEOL LTD·Filed 2015·Granted Mar 14, 2017·0 cites·5 claims
- 1829US4882559APermanent magnet type demagnetizing headMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1987·Granted Nov 21, 1989·0 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Kazuya Yamazaki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →