Inventor · disambiguated record
Kazuki Yoshioka
Also filed as: YOSHIOKA KAZUKI
8 granted patents·4 pending applications·5 citations·filing 2006–2024
75Inventor score
Files withPANASONIC CORP4KYOCERA DOCUMENT SOLUTIONS INC2LIXIL CORP2HITACHI LTD1MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1
Top patents by PatentIndex Score
12 records- 0168US12130578B2Image forming apparatusKYOCERA DOCUMENT SOLUTIONS INC·Filed 2023·Granted Oct 29, 2024·0 cites·6 claims
- 0262US7711917B2Semiconductor device and IC cardPANASONIC CORP·Filed 2007·Granted May 4, 2010·5 cites·13 claims
- 0360US12429799B2Toner cartridge and image forming apparatusKYOCERA DOCUMENT SOLUTIONS INC·Filed 2024·Granted Sep 30, 2025·0 cites·9 claims
- 0451US11561194B2Gas sensor element and gas sensorNGK SPARK PLUG CO·Filed 2019·Granted Jan 24, 2023·0 cites·4 claims
- 0551US2023113284A1Hydrophilic treatment coating composition and a hydrophilic treatment methodLIXIL CORP·Filed 2021·Application pending·0 cites
- 0650US2024067579A1Surface treatment agent, hydrophilized inorganic substrate, and method for producing sameLIXIL CORP·Filed 2021·Application pending·0 cites
- 0749US8981734B2Power source generation circuit and integrated circuitPANASONIC CORP·Filed 2013·Granted Mar 17, 2015·0 cites·11 claims
- 0844US2025238751A1Recommendation support device and recommendation support methodHITACHI LTD·Filed 2021·Application pending·0 cites
- 0940US9882399B2Power source generation circuit and integrated circuitSADAYUKI EIICHI·Filed 2011·Granted Jan 30, 2018·0 cites·21 claims
- 1039US7916549B2Memory self-test circuit, semiconductor device and IC card including the same, and memory self-test methodPANASONIC CORP·Filed 2009·Granted Mar 29, 2011·0 cites·18 claims
- 1136US7688637B2Memory self-test circuit, semiconductor device and IC card including the same, and memory self-test methodPANASONIC CORP·Filed 2007·Granted Mar 30, 2010·0 cites·18 claims
- 1233US2009150623A1Semiconductor device and test mode control circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →