Inventor · disambiguated record

Keito Aibara

Also filed as: AIBARA KEITO

3 granted patents·0 citations·filing 2022–2022

40Inventor score

Technology areasH01J

Files withJEOL LTD3

Top patents by PatentIndex Score

3 records

0163US11764029B2Method of measuring aberration and electron microscopeJEOL LTD·Filed 2022·Granted Sep 19, 2023·0 cites·13 claims
0257US12255041B2Electron microscope and method of correcting aberrationJEOL LTD·Filed 2022·Granted Mar 18, 2025·0 cites·11 claims
0357US11842880B2Estimation model generation method and electron microscopeJEOL LTD·Filed 2022·Granted Dec 12, 2023·0 cites·8 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →