Inventor · disambiguated record
Kenneth C. Arndt
Also filed as: ARNDT KENNETH · ARNDT KENNETH C
13 granted patents·291 citations·filing 1998–2001
93Inventor score
Top patents by PatentIndex Score
13 records- 0187US5966339AProgrammable/reprogrammable fuseIBM·Filed 1998·Granted Oct 12, 1999·69 cites·23 claims
- 0273US6194032B1Selective substrate metallizationMASSACHUSETTS INST TECHNOLOGY·Filed 1998·Granted Feb 27, 2001·44 cites·33 claims
- 0370US6274440B1Manufacturing of cavity fuses on gate conductor levelIBM·Filed 1999·Granted Aug 14, 2001·39 cites·16 claims
- 0470US6222244B1Electrically blowable fuse with reduced cross-sectional areaIBM·Filed 1998·Granted Apr 24, 2001·30 cites·8 claims
- 0568US6573585B2Electrically blowable fuse with reduced cross-sectional areaIBM·Filed 2001·Granted Jun 3, 2003·11 cites·5 claims
- 0665US6288436B1Mixed fuse technologiesIBM·Filed 1999·Granted Sep 11, 2001·31 cites·13 claims
- 0761US6548358B2Electrically blowable fuse with reduced cross-sectional areaIBM·Filed 2001·Granted Apr 15, 2003·7 cites·21 claims
- 0858US6495901B2Multi-level fuse structureINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 17, 2002·9 cites·16 claims
- 0955US6278171B2Sublithographic fuses using a phase shift maskIBM·Filed 2000·Granted Aug 21, 2001·5 cites·5 claims
- 1047US6190986B1Method of producing sulithographic fuses using a phase shift maskIBM·Filed 1999·Granted Feb 20, 2001·11 cites·20 claims
- 1147US5939335AMethod for reducing stress in the metallization of an integrated circuitIBM·Filed 1998·Granted Aug 17, 1999·11 cites·24 claims
- 1246US6208008B1Integrated circuits having reduced stress in metallizationIBM·Filed 1999·Granted Mar 27, 2001·10 cites·11 claims
- 1343US6037648ASemiconductor structure including a conductive fuse and process for fabrication thereofIBM·Filed 1998·Granted Mar 14, 2000·14 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →