Inventor · disambiguated record
Kevin Cota
Also filed as: COTA KEVIN
8 granted patents·185 citations·filing 2000–2005
87Inventor score
Top patents by PatentIndex Score
8 records- 0194US6807655B1Adaptive off tester screening method based on intrinsic die parametric measurementsLSI LOGIC CORP·Filed 2002·Granted Oct 19, 2004·107 cites·18 claims
- 0282US6598194B1Test limits based on positionLSI LOGIC CORP·Filed 2000·Granted Jul 22, 2003·31 cites·20 claims
- 0378US6943042B2Method of detecting spatially correlated variations in a parameter of an integrated circuit dieLSI LOGIC CORP·Filed 2003·Granted Sep 13, 2005·19 cites·7 claims
- 0476US6787379B1Method of detecting spatially correlated variations in a parameter of an integrated circuit dieLSI LOGIC CORP·Filed 2001·Granted Sep 7, 2004·17 cites·3 claims
- 0565US7390680B2Method to selectively identify reliability risk die based on characteristics of local regions on the waferLSI CORP·Filed 2005·Granted Jun 24, 2008·2 cites·10 claims
- 0654US6782500B1Statistical decision systemLSI LOGIC CORP·Filed 2000·Granted Aug 24, 2004·7 cites·20 claims
- 0748US6880140B2Method to selectively identify reliability risk die based on characteristics of local regions on the waferLSI LOGIC CORP·Filed 2003·Granted Apr 12, 2005·2 cites·9 claims
- 0840US7305634B2Method to selectively identify at risk die based on location within the reticleLSI CORP·Filed 2004·Granted Dec 4, 2007·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →