Inventor · disambiguated record
Kei Fujii
Also filed as: FUJII KEI
26 granted patents·9 pending applications·47 citations·filing 2003–2024
93Inventor score
Top patents by PatentIndex Score
35 records- 0191US9123843B2Semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Sep 1, 2015·8 cites·10 claims
- 0284US9773932B2Epitaxial wafer and method for manufacturing sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Sep 26, 2017·6 cites·11 claims
- 0383US9608148B2Semiconductor element and method for producing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Granted Mar 28, 2017·3 cites·6 claims
- 0481US9040955B2Semiconductor device, optical sensor device and semiconductor device manufacturing methodFUJII KEI·Filed 2011·Granted May 26, 2015·2 cites·11 claims
- 0581US8642943B2Semiconductor wafer, light-receiving element, light-receiving element array, hybrid-type detection device, optical sensor device, and process for production of semiconductor waferMORI HIROKI·Filed 2010·Granted Feb 4, 2014·4 cites·16 claims
- 0677US8461570B2Semiconductor device and manufacturing method thereofFUJII KEI·Filed 2010·Granted Jun 11, 2013·4 cites·7 claims
- 0773US9129808B2Epitaxial wafer, photodiode, optical sensor device, and methods for producing epitaxial wafer and photodiodeFUJII KEI·Filed 2011·Granted Sep 8, 2015·3 cites·10 claims
- 0872US12470046B2Vertical cavity surface-emitting laserSUMITOMO ELECTRIC INDUSTRIES·Filed 2022·Granted Nov 11, 2025·0 cites·9 claims
- 0971US8198623B2Photodiode array, method for manufacturing photodiode array, epitaxial wafer, and method for manufacturing epitaxial waferAKITA KATSUSHI·Filed 2010·Granted Jun 12, 2012·2 cites·11 claims
- 1067US9159853B2Group III-V compound semiconductor photo detector, method of fabricating group III-V compound semiconductor photo detector, photo detector, and epitaxial waferSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Granted Oct 13, 2015·1 cites·7 claims
- 1165US9680040B2Semiconductor device and method for manufacturing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Jun 13, 2017·1 cites·14 claims
- 1265US8866199B2Group III-V compound semiconductor photo detector, method of fabricating group III-V compound semiconductor photo detector, photo detector, and epitaxial waferAKITA KATSUSHI·Filed 2010·Granted Oct 21, 2014·1 cites·7 claims
- 1364US9887310B2Semiconductor layered structure, method for producing semiconductor layered structure, and method for producing semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Granted Feb 6, 2018·1 cites·10 claims
- 1459US8548021B2III-nitride semiconductor laser, and method for fabricating III-nitride semiconductor laserFUJII KEI·Filed 2011·Granted Oct 1, 2013·1 cites·19 claims
- 1559US2024379362A1Method of producing p-type nitride semiconductorSUMITOMO ELECTRIC INDUSTRIES·Filed 2024·Application pending·0 cites
- 1658US10938181B2Vertical cavity surface emitting laser and method for manufacturing vertical cavity surface emitting laserSUMITOMO ELECTRIC INDUSTRIES·Filed 2019·Granted Mar 2, 2021·0 cites·6 claims
- 1758US2014054545A1Photodetector, epitaxial wafer and method for producing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2012·Application pending·0 cites
- 1857US8252372B2Method of forming sprayed film on the inner surface of a boreTERADA DAISUKE·Filed 2008·Granted Aug 28, 2012·3 cites·12 claims
- 1957US7052401B2Sealing structure for cross shaftKOYO SEIKO CO·Filed 2003·Granted May 30, 2006·7 cites·3 claims
- 2056US8822977B2Photodetector and method of manufacturing the photodetectorAKITA KATSUSHI·Filed 2011·Granted Sep 2, 2014·0 cites·10 claims
- 2156US2015001466A1Group iii-v compound semiconductor photo detector, method of fabricating group iii-v compound semiconductor photo detector, photo detector, and epitaxial waferSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Application pending·0 cites
- 2255US2013313521A1Photodiode and method for producing the sameAKITA KATSUSHI·Filed 2012·Application pending·0 cites
- 2354US8921829B2Light receiving element, light receiving element array, hybrid-type detecting device, optical sensor device, and method for producing light receiving element arrayIGUCHI YASUHIRO·Filed 2011·Granted Dec 30, 2014·0 cites·12 claims
- 2454US2014353586A1Semiconductor element and method for producing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Application pending·0 cites
- 2551US10594110B2Vertical cavity surface emitting laser, method for fabricating vertical cavity surface emitting laserSUMITOMO ELECTRIC INDUSTRIES·Filed 2018·Granted Mar 17, 2020·0 cites·5 claims
- 2651US8309380B2Photodiode array, method for manufacturing photodiode array, epitaxial wafer, and method for manufacturing epitaxial waferAKITA KATSUSHI·Filed 2012·Granted Nov 13, 2012·0 cites·12 claims
- 2750US9818895B2Semiconductor device, optical sensor device and semiconductor device manufacturing methodSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Granted Nov 14, 2017·0 cites·8 claims
- 2849US9698287B2Epitaxial wafer, method for producing the same, semiconductor element, and optical sensor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Jul 4, 2017·0 cites·11 claims
- 2947US9171978B2Epitaxial wafer, method for producing the same, photodiode, and optical sensor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Oct 27, 2015·0 cites·8 claims
- 3044US2020028328A1Vertical cavity surface emitting laserSUMITOMO ELECTRIC INDUSTRIES·Filed 2019·Application pending·0 cites
- 3143US7874893B2Honing method and honing control deviceNISSAN MOTOR·Filed 2008·Granted Jan 25, 2011·0 cites·15 claims
- 3242US2014367640A1Light-emitting element, epitaxial wafer, and method for producing the epitaxial waferSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Application pending·0 cites
- 3340US9190544B2Photodiode, optical sensor device, and photodiode manufacturing methodFUJII KEI·Filed 2011·Granted Nov 17, 2015·0 cites·12 claims
- 3439US2014008614A1Photodiode and method for producing the sameFUJII KEI·Filed 2012·Application pending·0 cites
- 3539US2016380137A1Light-receiving deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →