Inventor · disambiguated record
Keita Fujino
Also filed as: Fujino Keita
6 granted patents·2 pending applications·5 citations·filing 2018–2023
70Inventor score
Files withSHIMADZU CORP8
Top patents by PatentIndex Score
8 records- 0185US10598691B2Scanning probe microscope and light intensity adjusting methodSHIMADZU CORP·Filed 2019·Granted Mar 24, 2020·2 cites·4 claims
- 0280US10996238B2Surface analyzerSHIMADZU CORP·Filed 2020·Granted May 4, 2021·2 cites·9 claims
- 0374US11054441B2Scanning probe microscope and position adjustment method for scanning probe microscopeSHIMADZU CORP·Filed 2020·Granted Jul 6, 2021·1 cites·11 claims
- 0461US12306208B2Information providing system, server device, and analyzerSHIMADZU CORP·Filed 2022·Granted May 20, 2025·0 cites·10 claims
- 0555US11454647B2Scanning type probe microscope and control device for scanning type probe microscopeSHIMADZU CORP·Filed 2018·Granted Sep 27, 2022·0 cites·11 claims
- 0653US2025252541A1Data Processing Method, Program, Image Processing Device, and Scanning Probe MicroscopeSHIMADZU CORP·Filed 2023·Application pending·0 cites
- 0751US2022358636A1Analyzer, display control method, and recording medium storing display control programSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 0850US10641790B2Scanning probe microscopeSHIMADZU CORP·Filed 2019·Granted May 5, 2020·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →