Inventor · disambiguated record
Kevin Gearhardt
Also filed as: GEARHARDT KEVIN · GEARHARDT KEVIN J
12 granted patents·2 pending applications·194 citations·filing 1992–2005
90Inventor score
Top patents by PatentIndex Score
14 records- 0186US7202656B1Methods and structure for improved high-speed TDF testing using on-chip PLLLSI LOGIC CORP·Filed 2005·Granted Apr 10, 2007·19 cites·4 claims
- 0283US5701309AAutomated test equipment digital tester expansion apparatusAT & T GLOBAL INF SOLUTION·Filed 1992·Granted Dec 23, 1997·71 cites·22 claims
- 0376US7081841B1Analog to digital converter built in self testLSI LOGIC CORP·Filed 2005·Granted Jul 25, 2006·11 cites·3 claims
- 0476US6216254B1Integrated circuit design using a frequency synthesizer that automatically ensures testabilityLSI LOGIC CORP·Filed 1998·Granted Apr 10, 2001·45 cites·14 claims
- 0557US6408265B1Metastability risk simulation analysis tool and methodLSI LOGIC CORP·Filed 1999·Granted Jun 18, 2002·32 cites·9 claims
- 0655US7375570B2High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devicesLSI LOGIC CORP·Filed 2005·Granted May 20, 2008·2 cites·12 claims
- 0751US7240264B2Scan test expansion moduleLSI CORP·Filed 2005·Granted Jul 3, 2007·2 cites·3 claims
- 0851US7042242B2Built-in self test technique for programmable impedance drivers for RapidChip and ASIC driversLSI LOGIC CORP·Filed 2004·Granted May 9, 2006·5 cites·12 claims
- 0945US7152012B2Four point measurement technique for programmable impedance drivers RapidChip and ASIC devicesLSI LOGIC CORP·Filed 2004·Granted Dec 19, 2006·3 cites·7 claims
- 1042US7272763B2Built-in self test circuitry for process monitor circuit for rapidchip and ASIC devicesLSI CORP·Filed 2004·Granted Sep 18, 2007·4 cites·17 claims
- 1135US2006068054A1Technique for high-speed TDF testing on low cost testers using on-chip or off-chip circuitry for RapidChip and ASIC devicesGEARHARDT KEVIN·Filed 2004·Application pending·0 cites
- 1235US2006085706A1High speed on chip testingGEARHARDT KEVIN J·Filed 2004·Application pending·0 cites
- 1333US7216279B2Testing with high speed pulse generatorLSI LOGIC CORP·Filed 2005·Granted May 8, 2007·0 cites·10 claims
- 1429US7106074B2Technique for measurement of programmable termination resistor networks on rapidchip and ASIC devicesLSI LOGIC CORP·Filed 2004·Granted Sep 12, 2006·0 cites·4 claims
Join the waitlist — get patent alerts
Get an alert when Kevin Gearhardt files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →