Inventor · disambiguated record
Ken Harada
Also filed as: HARADA KEN
34 granted patents·5 pending applications·153 citations·filing 1998–2023
96Inventor score
Top patents by PatentIndex Score
39 records- 0187US8946628B2Electron beam interference device and electron beam interferometryHARADA KEN·Filed 2012·Granted Feb 3, 2015·9 cites·14 claims
- 0287US7538323B2InterferometerRIKEN·Filed 2005·Granted May 26, 2009·13 cites·16 claims
- 0386US7923685B2Electron beam deviceHITACHI LTD·Filed 2008·Granted Apr 12, 2011·9 cites·8 claims
- 0485US7750298B2Interferometer having three electron biprismsRIKEN·Filed 2006·Granted Jul 6, 2010·10 cites·10 claims
- 0584US8193494B2Transmission electron microscope and method for observing specimen image with the sameHARADA KEN·Filed 2010·Granted Jun 5, 2012·7 cites·20 claims
- 0684US7816648B2Electron interferometer or electron microscopeRIKEN·Filed 2005·Granted Oct 19, 2010·10 cites·30 claims
- 0780US7872755B2InterferometerRIKEN·Filed 2006·Granted Jan 18, 2011·8 cites·9 claims
- 0880US7655905B2Charged particle beam equipmentRIKEN·Filed 2006·Granted Feb 2, 2010·6 cites·24 claims
- 0978US8785851B2Interference electron microscopeRIKEN·Filed 2013·Granted Jul 22, 2014·4 cites·31 claims
- 1078US6838675B2Specimen observation system for applying external magnetic fieldHITACHI LTD·Filed 2002·Granted Jan 4, 2005·14 cites·25 claims
- 1177US9679738B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 13, 2017·3 cites·16 claims
- 1276US6863931B2Manufacturing method of product having sprayed coating filmNISSAN MOTOR·Filed 2002·Granted Mar 8, 2005·22 cites·13 claims
- 1374US7939801B2Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation methodHITACHI LTD·Filed 2008·Granted May 10, 2011·3 cites·18 claims
- 1465US9365802B2Cleaning liquid for semiconductor device substrates and method of cleaning substrate for semiconductor devicesMITSUBISHI CHEM CORP·Filed 2013·Granted Jun 14, 2016·1 cites·12 claims
- 1563US2024417742A1Method for culturing microorganism, transformed microorganism, and method for producing poly(3-hydroxyalkanoate)KANEKA CORP·Filed 2022·Application pending·0 cites
- 1662US8653472B2Electromagnetic field application systemHARADA KEN·Filed 2010·Granted Feb 18, 2014·1 cites·16 claims
- 1757US6170257B1Variable thrust nozzle systemKAWASAKI HEAVY IND LTD·Filed 1998·Granted Jan 9, 2001·21 cites·9 claims
- 1857US2023374383A1Etching Composition, Etching Method, Method for Manufacturing Semiconductor Device, and Method for Manufacturing Gate-All-Around-Type TransistorMITSUBISHI CHEM CORP·Filed 2023·Application pending·0 cites
- 1956US7999652B2Thick film resistorHITACHI LTD·Filed 2008·Granted Aug 16, 2011·2 cites·12 claims
- 2055US10210962B2Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction gratingHITACHI LTD·Filed 2014·Granted Feb 19, 2019·1 cites·10 claims
- 2154US11677092B2Assembly method using assembly toolHONDA MOTOR CO LTD·Filed 2021·Granted Jun 13, 2023·0 cites·8 claims
- 2253US11597896B2Cleaning liquid, cleaning method, and method for producing semiconductor waferMITSUBISHI CHEM CORP·Filed 2021·Granted Mar 7, 2023·0 cites·13 claims
- 2353US11545712B2Shape correction device for frame body, and method for manufacturing electrolyte film/electrode structure provided with resin frame for fuel cellHONDA MOTOR CO LTD·Filed 2018·Granted Jan 3, 2023·0 cites·2 claims
- 2452US11066627B2Cleaning agent composition for semiconductor device substrate, method of cleaning semiconductor device substrate, method of manufacturing semiconductor device substrate, and semiconductor device substrateMITSUBISHI CHEM CORP·Filed 2019·Granted Jul 20, 2021·0 cites·17 claims
- 2552US10113141B2Cleaning liquid for semiconductor device and method for cleaning substrate for semiconductor deviceMITSUBISHI CHEM CORP·Filed 2014·Granted Oct 30, 2018·0 cites·8 claims
- 2651US10770264B2Interference optical system unit, charged particle beam interference apparatus, and method for observing charged particle beam interference imageRIKEN·Filed 2019·Granted Sep 8, 2020·0 cites·15 claims
- 2751US7808814B2Magnetization state control device and magnetic information recording deviceRIKEN·Filed 2008·Granted Oct 5, 2010·2 cites·9 claims
- 2849US11551907B2Electron microscope and sample observation method using the sameRIKEN·Filed 2019·Granted Jan 10, 2023·0 cites·15 claims
- 2947US11011344B2Interferometric electron microscopeHITACHI LTD·Filed 2020·Granted May 18, 2021·0 cites·12 claims
- 3046US11149231B2Cleaning liquid, cleaning method, and method for producing semiconductor waferMITSUBISHI CHEM CORP·Filed 2020·Granted Oct 19, 2021·0 cites·20 claims
- 3146US9864114B2Zone plate having annular or spiral shape and Y-shaped branching edge dislocationHARADA KEN·Filed 2011·Granted Jan 9, 2018·0 cites·7 claims
- 3244US8772715B2Electron beam device including a first electron biprism to split an electron beam into two beams and a second electron biprism in the image forming lens system to superpose the two beamsRIKEN·Filed 2013·Granted Jul 8, 2014·0 cites·20 claims
- 3343US11024482B2Holography reconstruction method and programRIKEN·Filed 2018·Granted Jun 1, 2021·0 cites·15 claims
- 3443US10535497B2Electron microscope and imaging methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 14, 2020·0 cites·14 claims
- 3543US2013225464A1Cleaning liquid for semiconductor device substrates and cleaning methodMITSUBISHI CHEM CORP·Filed 2013·Application pending·0 cites
- 3641US10948426B2Particle beam device, observation method, and diffraction gratingRIKEN·Filed 2017·Granted Mar 16, 2021·0 cites·10 claims
- 3741US2014197312A1Electron microscope and sample observation methodHARADA KEN·Filed 2011·Application pending·0 cites
- 3838US2012241612A1Electron Beam Biprism Device and Electron Beam DeviceHARADA KEN·Filed 2010·Application pending·0 cites
- 3936US6077118AElectrical connector having a metal shellMOLEX INC·Filed 1998·Granted Jun 20, 2000·7 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →