Inventor · disambiguated record
Kenichi Iguchi
Also filed as: IGUCHI KENICHI
28 granted patents·4 pending applications·33 citations·filing 1996–2023
93Inventor score
Files withFUJI ELECTRIC CO LTD20KOA CORP6NATIONAL INSTITUTE OF TECH1TAKEMOTO OIL & FAT CO LTD1UNIV KYUSHU NAT UNIV CORP1
Top patents by PatentIndex Score
32 records- 0185US8278682B2Semiconductor deviceYOSHIKAWA KOH·Filed 2011·Granted Oct 2, 2012·9 cites·20 claims
- 0280US12493010B2Gas sensorKOA CORP·Filed 2023·Granted Dec 9, 2025·0 cites·7 claims
- 0380US9659774B2Impurity introducing method, impurity introducing apparatus, and method of manufacturing semiconductor elementFUJI ELECTRIC CO LTD·Filed 2015·Granted May 23, 2017·3 cites·22 claims
- 0479US10727060B2Doping system, doping method and method for manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted Jul 28, 2020·2 cites·7 claims
- 0579US9779968B2Method for processing semiconductor substrate and method for manufacturing semiconductor device in which said processing method is usedFUJI ELECTRIC CO LTD·Filed 2016·Granted Oct 3, 2017·3 cites·21 claims
- 0676US9825145B2Method of manufacturing silicon carbide semiconductor device including forming an electric field control region by a laser doping technologyFUJI ELECTRIC CO LTD·Filed 2016·Granted Nov 21, 2017·2 cites·15 claims
- 0776US9659775B2Method for doping impurities, method for manufacturing semiconductor deviceUNIV KYUSHU NAT UNIV CORP·Filed 2016·Granted May 23, 2017·2 cites·24 claims
- 0875US10658183B2Impurity adding apparatus, impurity adding method, and semiconductor element manufacturing methodFUJI ELECTRIC CO LTD·Filed 2016·Granted May 19, 2020·2 cites·13 claims
- 0975US9716008B2Apparatus for doping impurities, method for doping impurities, and method for manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Jul 25, 2017·2 cites·12 claims
- 1075US9564334B2Method of manufacturing a semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Feb 7, 2017·2 cites·9 claims
- 1175US9548205B2Method of manufacturing a semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Jan 17, 2017·2 cites·9 claims
- 1267US8604584B2Semiconductor device and method of manufacturing semiconductor deviceWAKIMOTO HIROKI·Filed 2011·Granted Dec 10, 2013·2 cites·6 claims
- 1364US9972499B2Method for forming metal-semiconductor alloy using hydrogen plasmaFUJI ELECTRIC CO LTD·Filed 2016·Granted May 15, 2018·1 cites·14 claims
- 1463US9892919B2Semiconductor device manufacturing methodFUJI ELECTRIC CO LTD·Filed 2015·Granted Feb 13, 2018·1 cites·15 claims
- 1562US2021010963A1Gas sensor and manufacturing method thereforKOA CORP·Filed 2019·Application pending·0 cites
- 1661US12241852B2Gas sensor and method for producing alkaline earth ferriteNATIONAL INSTITUTE OF TECH·Filed 2020·Granted Mar 4, 2025·0 cites·10 claims
- 1758US11977042B2Gas sensor and method for manufacturing sameKOA CORP·Filed 2019·Granted May 7, 2024·0 cites·6 claims
- 1857US2024088276A1Semiconductor apparatus and method for manufacturing semiconductor apparatusFUJI ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 1956US11370671B2Zinc oxide varistorKOA CORP·Filed 2019·Granted Jun 28, 2022·0 cites·7 claims
- 2054US10109501B2Manufacturing method of semiconductor device having a voltage resistant structureFUJI ELECTRIC CO LTD·Filed 2017·Granted Oct 23, 2018·0 cites·3 claims
- 2154US9786749B2Semiconductor device having a voltage resistant structureFUJI ELECTRIC CO LTD·Filed 2016·Granted Oct 10, 2017·0 cites·9 claims
- 2254US9355858B2Method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted May 31, 2016·0 cites·15 claims
- 2353US10453687B2Method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted Oct 22, 2019·0 cites·16 claims
- 2451US11370712B2Zinc oxide varistor and method for manufacturing sameKOA CORP·Filed 2017·Granted Jun 28, 2022·0 cites·12 claims
- 2549US11069779B2Silicon carbide semiconductor device and method for manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2019·Granted Jul 20, 2021·0 cites·19 claims
- 2648US9577032B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2014·Granted Feb 21, 2017·0 cites·16 claims
- 2748US2024210342A1Resistive oxygen gas sensor and oxygen sensor deviceUNIV NAGAOKA TECHNOLOGY·Filed 2022·Application pending·0 cites
- 2846US11245010B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2020·Granted Feb 8, 2022·0 cites·8 claims
- 2945US11264240B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2019·Granted Mar 1, 2022·0 cites·16 claims
- 3043US2021041409A1Oxygen sensor elementKOA CORP·Filed 2019·Application pending·0 cites
- 3136US10559664B2Method of manufacturing semiconductor device by removing a bulk layer to expose an epitaxial-growth layer and by removing portions of a supporting-substrate to expose portions of the epitaxial-growth layerFUJI ELECTRIC CO LTD·Filed 2017·Granted Feb 11, 2020·0 cites·19 claims
- 3228US5846593AFood materials containing sesaminol triglucoside derived from sesame seedsTAKEMOTO OIL & FAT CO LTD·Filed 1996·Granted Dec 8, 1998·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →