Inventor · disambiguated record
Kenichi Imura
Also filed as: IMURA KENICHI
14 granted patents·1 pending application·251 citations·filing 1992–2008
93Inventor score
Top patents by PatentIndex Score
15 records- 0193US6596561B2Method of manufacturing a semiconductor device using reinforcing patterns for ensuring mechanical strength during manufactureHITACHI LTD·Filed 2001·Granted Jul 22, 2003·65 cites·35 claims
- 0291US7015069B2Method of manufacturing a semiconductor device and a semiconductor deviceHITACHI YONEZAWA ELECTRONICS·Filed 2005·Granted Mar 21, 2006·22 cites·6 claims
- 0389US7295030B2Thin film transistor tester and corresponding test methodIBM·Filed 2005·Granted Nov 13, 2007·9 cites·17 claims
- 0483US7322531B2Electronic device and method of manufacturing the sameHITACHI ULSI SYS CO LTD·Filed 2006·Granted Jan 29, 2008·11 cites·25 claims
- 0582US6723583B2Method of manufacturing a semiconductor device using a moldRENESAS TECH CORP·Filed 2003·Granted Apr 20, 2004·25 cites·22 claims
- 0681US7467464B2Method of manufacturing a memory cardRENESAS TECH CORP·Filed 2007·Granted Dec 23, 2008·9 cites·8 claims
- 0778US5371044AMethod of uniformly encapsulating a semiconductor device in resinHITACHI LTD·Filed 1992·Granted Dec 6, 1994·60 cites·20 claims
- 0875US7803660B2Method of manufacturing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2008·Granted Sep 28, 2010·6 cites·7 claims
- 0972US6872597B2Method of manufacturing a semiconductor device and a semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Mar 29, 2005·13 cites·15 claims
- 1071US6797542B2Fabrication method of semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2003·Granted Sep 28, 2004·18 cites·7 claims
- 1166US7465609B2Method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2005·Granted Dec 16, 2008·3 cites·5 claims
- 1255US7282943B2Inspection device for inspecting TFTIBM·Filed 2004·Granted Oct 16, 2007·8 cites·9 claims
- 1345US7086600B2Electronic device and method of manufacturing the sameHITACHI ULSI SYS CO LTD·Filed 2001·Granted Aug 8, 2006·2 cites·49 claims
- 1441US2008164902A1Inspection device for inspecting tftSAKAGUCHI YOSHITAMI·Filed 2007·Application pending·0 cites
- 1533US7144755B2Fabrication method of semiconductor integrated circuit deviceEASTERN JAPAN SEMICONDUCTOR TE·Filed 2004·Granted Dec 5, 2006·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →