Inventor · disambiguated record
Kevyn Barry Jonas
Also filed as: JONAS KEVYN B · JONAS KEVYN BARRY
24 granted patents·6 pending applications·338 citations·filing 2000–2023
96Inventor score
Top patents by PatentIndex Score
30 records- 0195US8931183B2Measurement method and apparatusJONAS KEVYN BARRY·Filed 2011·Granted Jan 13, 2015·28 cites·15 claims
- 0295US6633051B1Surface sensing device with optical sensorRENISHAW PLC·Filed 2000·Granted Oct 14, 2003·95 cites·17 claims
- 0393US7809523B2Apparatus and method of measuring workpiecesRENISHAW PLC·Filed 2007·Granted Oct 5, 2010·40 cites·18 claims
- 0489US8474148B2Articulating probe head apparatus and methodJONAS KEVYN BARRY·Filed 2010·Granted Jul 2, 2013·11 cites·30 claims
- 0589US7861430B2Articulating probe head apparatus and methodRENISHAW PLC·Filed 2007·Granted Jan 4, 2011·20 cites·7 claims
- 0689US7543393B2Method of calibrating a scanning systemRENISHAW PLC·Filed 2007·Granted Jun 9, 2009·20 cites·17 claims
- 0787US7286949B2Method of error correctionRENISHAW PLC·Filed 2006·Granted Oct 23, 2007·19 cites·19 claims
- 0885US9739606B2Method and apparatus for inspecting workpiecesJONAS KEVYN BARRY·Filed 2012·Granted Aug 22, 2017·9 cites·25 claims
- 0984US8302321B2Apparatus and method of measuring workpiecesHUNTER STEPHEN PAUL·Filed 2011·Granted Nov 6, 2012·7 cites·36 claims
- 1082US7971365B2Apparatus and method of measuring workpiecesRENISHAW PLC·Filed 2007·Granted Jul 5, 2011·10 cites·16 claims
- 1181US11693384B2Production and measurement of workpiecesRENISHAW PLC·Filed 2018·Granted Jul 4, 2023·3 cites·26 claims
- 1281US8144340B2Surface sensing device with optical sensorMCFARLAND GEOFFREY·Filed 2010·Granted Mar 27, 2012·5 cites·15 claims
- 1379US7533574B2Method of error compensationRENISHAW PLC·Filed 2004·Granted May 19, 2009·23 cites·18 claims
- 1477US12257707B2Manufacturing system and methodRENISHAW PLC·Filed 2019·Granted Mar 25, 2025·2 cites·27 claims
- 1577USRE45211ESurface sensing device with optical sensorRENISHAW PLC·Filed 2012·Granted Oct 28, 2014·3 cites·31 claims
- 1676US7318284B2Method of calibrating a scanning systemRENISHAW PLC·Filed 2004·Granted Jan 15, 2008·19 cites·26 claims
- 1775US12174607B2Production and measurement of workpiecesRENISHAW PLC·Filed 2023·Granted Dec 24, 2024·0 cites·29 claims
- 1875US7847955B2Surface sensing device with optical sensorRENISHAW PLC·Filed 2006·Granted Dec 7, 2010·6 cites·17 claims
- 1973US9989347B2Method and apparatus for inspecting workpiecesRENISHAW PLC·Filed 2014·Granted Jun 5, 2018·5 cites·33 claims
- 2069US7885777B2Probe calibrationRENISHAW PLC·Filed 2006·Granted Feb 8, 2011·6 cites·21 claims
- 2162US9541385B2Measurement method and apparatusJONAS KEVYN BARRY·Filed 2011·Granted Jan 10, 2017·4 cites·20 claims
- 2260US7526873B2Use of surface measurement probesRENISHAW PLC·Filed 2005·Granted May 5, 2009·3 cites·27 claims
- 2355US11385630B2Production and measurement of workpiecesRENISHAW PLC·Filed 2018·Granted Jul 12, 2022·0 cites·11 claims
- 2451US2011056074A1Apparatus and method for electronic circuit manufactureRENISHAW PLC·Filed 2009·Application pending·0 cites
- 2547US2010327014A1Apparatus and method for fluid dispensingRENISHAW PLC·Filed 2009·Application pending·0 cites
- 2646US2016298959A1Calibration of motion systemsRENISHAW PLC·Filed 2014·Application pending·0 cites
- 2743US10222193B2Method and apparatus for inspecting workpiecesRENISHAW PLC·Filed 2015·Granted Mar 5, 2019·0 cites·17 claims
- 2843US2015051862A1Method and apparatus for inspecting workpiecesRENISHAW PLC·Filed 2013·Application pending·0 cites
- 2940US2017363403A1Method and apparatus for inspecting workpiecesRENISHAW PLC·Filed 2017·Application pending·0 cites
- 3037US2011273702A1Optical measuring method and systemRENISHAW PLC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →