Inventor · disambiguated record
Kevin Kjoller
Also filed as: KJOLLER KEVIN · KJOLLER KEVIN J
33 granted patents·3 pending applications·526 citations·filing 1997–2025
97Inventor score
Top patents by PatentIndex Score
36 records- 0199US10228388B2Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopyBRUKER NANO INC·Filed 2016·Granted Mar 12, 2019·24 cites·17 claims
- 0297US10942116B2Method and apparatus for enhanced photo-thermal imaging and spectroscopyPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2018·Granted Mar 9, 2021·26 cites·46 claims
- 0397US9134341B2Multiple modulation heterodyne infrared spectroscopyPRATER CRAIG·Filed 2012·Granted Sep 15, 2015·33 cites·21 claims
- 0496US9658247B2Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopyANASYS INSTR·Filed 2015·Granted May 23, 2017·18 cites·34 claims
- 0596US8646319B2Dynamic power control for nanoscale spectroscopyPRATER CRAIG·Filed 2010·Granted Feb 11, 2014·20 cites·24 claims
- 0696US8242448B2Dynamic power control, beam alignment and focus for nanoscale spectroscopyPRATER CRAIG·Filed 2010·Granted Aug 14, 2012·25 cites·23 claims
- 0795US11002665B2Method and apparatus for enhanced photo-thermal imaging and spectroscopyPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2017·Granted May 11, 2021·12 cites·2 claims
- 0895US10969405B2Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniquesPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2017·Granted Apr 6, 2021·11 cites·16 claims
- 0994US8001830B2High frequency deflection measurement of IR absorptionANASYS INSTR INC·Filed 2007·Granted Aug 23, 2011·35 cites·8 claims
- 1094US6862921B2Method and apparatus for manipulating a sampleVEECO INSTR INC·Filed 2001·Granted Mar 8, 2005·60 cites·9 claims
- 1193US8177422B2Transition temperature microscopyKJOLLER KEVIN·Filed 2008·Granted May 15, 2012·34 cites·18 claims
- 1292US8869602B2High frequency deflection measurement of IR absorptionBELKIN MIKHAIL·Filed 2011·Granted Oct 28, 2014·27 cites·30 claims
- 1392US8387443B2Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometerKING WILLIAM P·Filed 2009·Granted Mar 5, 2013·18 cites·34 claims
- 1491US8402819B2High frequency deflection measurement of IR absorptionDAZZI A DAZZI·Filed 2008·Granted Mar 26, 2013·36 cites·11 claims
- 1590US8680467B2High frequency deflection measurement of IR absorption with a modulated IR sourcePRATER CRAIG·Filed 2011·Granted Mar 25, 2014·10 cites·14 claims
- 1688US8607622B2High frequency deflection measurement of IR absorptionDAZZI ALEXANDRE·Filed 2011·Granted Dec 17, 2013·16 cites·6 claims
- 1785US12209950B2Method and apparatus for enhanced photo-thermal imaging and spectroscopyPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2023·Granted Jan 28, 2025·0 cites·42 claims
- 1885US7040147B2Method and apparatus for manipulating a sampleVEECO INSTR INC·Filed 2005·Granted May 9, 2006·8 cites·30 claims
- 1984US2025003865A1Method and apparatus for enhanced photo-thermal imaging and spectroscopyPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2024·Application pending·0 cites
- 2083US10914755B2Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopyBRUKER NANO INC·Filed 2019·Granted Feb 9, 2021·1 cites·16 claims
- 2183US9778282B2Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopyANASYS INSTR·Filed 2017·Granted Oct 3, 2017·2 cites·26 claims
- 2282US8418538B2High frequency deflection measurement of IR absorptionDAZZI A DAZZI·Filed 2011·Granted Apr 16, 2013·5 cites·2 claims
- 2381US12416566B2Automated spectroscopic analysis of micron-scale microplastic particles with optical photothermal infrared spectroscopyPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2023·Granted Sep 16, 2025·0 cites·30 claims
- 2479US5898106AMethod and apparatus for obtaining improved vertical metrology measurementsDIGITAL INSTR INC·Filed 1997·Granted Apr 27, 1999·61 cites·68 claims
- 2578US10082523B2Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopyANASYS INSTR·Filed 2017·Granted Sep 25, 2018·1 cites·6 claims
- 2678US7156965B1Scanning electrochemical potential microscopeVEECO INSTR INC·Filed 2001·Granted Jan 2, 2007·30 cites·16 claims
- 2775US11680892B2Method and apparatus for enhanced photo-thermal imaging and spectroscopyPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2021·Granted Jun 20, 2023·0 cites·9 claims
- 2875US7665889B2Quantitative calorimetry signal for sub-micron scale thermal analysisKJOLLER KEVIN·Filed 2007·Granted Feb 23, 2010·6 cites·10 claims
- 2974US7334460B2Method and apparatus of manipulating a sampleVEECO INSTR INC·Filed 2006·Granted Feb 26, 2008·4 cites·16 claims
- 3071US11714103B2Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopyBRUKER NANO INC·Filed 2021·Granted Aug 1, 2023·0 cites·22 claims
- 3170US2025277739A1Method and apparaatus for improved composite multi-wavelength photothermal infarared imagingPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2025·Application pending·0 cites
- 3268US12332168B2Method and apparatus for improved composite multi-wavelength photothermal infrared imagingPHOTOTHERMAL SPECTROSCOPY CORP·Filed 2023·Granted Jun 17, 2025·0 cites·14 claims
- 3362US8857247B2Probe for a scanning probe microscope and method of manufactureKJOLLER KEVIN J·Filed 2008·Granted Oct 14, 2014·2 cites·12 claims
- 3457US11226285B2Surface sensitive atomic force microscope based infrared spectroscopyBRUKER NANO INC·Filed 2018·Granted Jan 18, 2022·0 cites·18 claims
- 3557US10557789B2Nanoscale infrared spectroscopy with multi-frequency atomic force microscopyBRUKER NANO INC·Filed 2013·Granted Feb 11, 2020·1 cites·24 claims
- 3641US2006213289A1Probe for a scanning probe microscope and method of manufactureKJOLLER KEVIN J·Filed 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Kevin Kjoller files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →