Inventor · disambiguated record
Kenji Kudou
Also filed as: KUDOU KENJI
2 granted patents·4 citations·filing 2007–2013
46Inventor score
Top patents by PatentIndex Score
2 records- 0159US7953269B2Method for inspecting pattern defect occured on patterns formed on a substrateFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted May 31, 2011·3 cites·10 claims
- 0254US9451380B2Apparatus and method for localizing sound image for vehicle's driverDENSO CORP·Filed 2013·Granted Sep 20, 2016·1 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →