Inventor · disambiguated record
Kenichi Kusumoto
Also filed as: KUSUMOTO KENICHI
9 granted patents·2 pending applications·32 citations·filing 1986–2022
83Inventor score
Top patents by PatentIndex Score
11 records- 0180US10109635B2Method of forming semiconductor device including tungsten layerMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 23, 2018·3 cites·11 claims
- 0274US11043414B2Microelectronic devices with conductive contacts to silicide regions, and related devicesMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 22, 2021·2 cites·9 claims
- 0364US5268141AIron based alloy having low contents of aluminum silicon, magnesium, calcium, oxygen, sulphur, and nitrogenMITSUI SHIPBUILDING ENG·Filed 1991·Granted Dec 7, 1993·18 cites·7 claims
- 0455US10438954B2Method of forming semiconductor device including tungsten layerMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 8, 2019·0 cites·9 claims
- 0546US12193219B2Apparatuses of controlling cross-layer reactions in semiconductor deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 7, 2025·0 cites·18 claims
- 0641US4729787AMethod of producing an iron; cobalt and nickel base alloy having low contents of sulphur, oxygen and nitrogenMITSUI SHIPBUILDING ENG·Filed 1986·Granted Mar 8, 1988·4 cites·16 claims
- 0740US8299129B2Peptide lipid-containing carrier and method for introducing compound into cells using sameKUSUMOTO KENICHI·Filed 2006·Granted Oct 30, 2012·0 cites·20 claims
- 0839US11075274B2Conductive line construction, memory circuitry, and method of forming a conductive line constructionMICRON TECHNOLOGY INC·Filed 2019·Granted Jul 27, 2021·0 cites·19 claims
- 0939US2009065779A1Semiconductor device and manufacturing method thereofELPIDA MEMORY INC·Filed 2008·Application pending·0 cites
- 1037US4820485AMethod of producing an iron-, cobalt- and nickel-base alloy having low contents of sulphur, oxygen and nitrogenMITSUI SHIPBUILDING ENG·Filed 1987·Granted Apr 11, 1989·5 cites·4 claims
- 1136US2013089981A1Method of manufacturing semiconductor deviceELPIDA MEMORY INC·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →