Inventor · disambiguated record
Kenneth W. Marr
Also filed as: MARR KENNETH · MARR KENNETH W · MARR KENNETH WILLIAM
66 granted patents·16 pending applications·1,131 citations·filing 1995–2025
99Inventor score
Top patents by PatentIndex Score
82 records- 0196US6630724B1Gate dielectric antifuse circuits and methods for operating sameMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 7, 2003·101 cites·34 claims
- 0296US6529421B1SRAM array with temperature-compensated threshold voltageMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 4, 2003·105 cites·65 claims
- 0395US9557376B2Apparatuses and methods for die seal crack detectionMICRON TECHNOLOGY INC·Filed 2016·Granted Jan 31, 2017·10 cites·5 claims
- 0494US9287184B2Apparatuses and methods for die seal crack detectionMICRON TECHNOLOGY INC·Filed 2013·Granted Mar 15, 2016·14 cites·9 claims
- 0594US6979601B2Methods for fabricating fuses for use in semiconductor devices and semiconductor devices including such fusesMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 27, 2005·55 cites·34 claims
- 0693US5742555AMethod of anti-fuse repairMICRON TECHNOLOGY INC·Filed 1996·Granted Apr 21, 1998·105 cites·22 claims
- 0790US6809968B2SRAM array with temperature-compensated threshold voltageMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 26, 2004·48 cites·24 claims
- 0889US6430016B1Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clampMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 6, 2002·42 cites·100 claims
- 0988US10431577B2Methods of forming circuit-protection devicesMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 1, 2019·3 cites·7 claims
- 1088US6879018B2Fuse for use in a semiconductor device, and semiconductor devices including the fuseMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 12, 2005·32 cites·41 claims
- 1187US7030458B2Gate dielectric antifuse circuits and methods for operating sameMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 18, 2006·29 cites·36 claims
- 1287US6936909B2Gate dielectric antifuse circuit to protect a high-voltage transistorMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 30, 2005·31 cites·20 claims
- 1387US6515931B2Method of anti-fuse repairMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 4, 2003·34 cites·32 claims
- 1487US6041008AMethod and apparatus for embedded read only memory in static random access memoryMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 21, 2000·68 cites·65 claims
- 1585US10580766B2Methods of forming circuit-protection devicesMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 3, 2020·2 cites·20 claims
- 1685US9281078B2Program operations with embedded leak checksMICRON TECHNOLOGY INC·Filed 2014·Granted Mar 8, 2016·7 cites·23 claims
- 1785US7101738B2Gate dielectric antifuse circuit to protect a high-voltage transistorMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 5, 2006·26 cites·24 claims
- 1885US6323534B1Fuse for use in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 27, 2001·50 cites·89 claims
- 1983US6894526B2Apparatus for determining burn-in reliability from wafer level burn-inMICRON TECHNOLOGY INC·Filed 2004·Granted May 17, 2005·16 cites·28 claims
- 2083US6233194B1Method of anti-fuse repairMICRON TECHNOLOGY INC·Filed 2000·Granted May 15, 2001·23 cites·47 claims
- 2182US2025343083A1Memory device including circuitry under bond padsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2281US7126871B2Circuits and methods to protect a gate dielectric antifuseMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 24, 2006·25 cites·32 claims
- 2380US6410367B2Fuse for use in a semiconductor device, and semiconductor devices including the fuseMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 25, 2002·18 cites·33 claims
- 2479US12237278B2Active protection circuits for semiconductor devicesMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 25, 2025·0 cites·12 claims
- 2579US11424169B2Memory device including circuitry under bond padsMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 23, 2022·2 cites·17 claims
- 2679US7425472B2Semiconductor fuses and semiconductor devices containing the sameMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 16, 2008·7 cites·12 claims
- 2779US2025308600A1Discharge circuitsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2878US6768617B2Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clampMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 27, 2004·21 cites·17 claims
- 2978US6081464ACircuit for SRAM test mode isolated bitline modulationMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 27, 2000·32 cites·9 claims
- 3077US12015026B2Methods of forming circuit-protection devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 18, 2024·0 cites·20 claims
- 3177US6836000B1Antifuse structure and method of useMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 28, 2004·20 cites·38 claims
- 3276US2025192075A1Active protection circuits for semiconductor devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3375US12229024B2Memory system failure detection and self recovery of memory diceMICRON TECHNOLOGY INC·Filed 2024·Granted Feb 18, 2025·0 cites·20 claims
- 3475US11676917B2Active protection circuits for semiconductor devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 13, 2023·0 cites·11 claims
- 3575US5978248AMethod of anti-fuse repairMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 2, 1999·32 cites·17 claims
- 3674US11189536B2Method and apparatus for on-chip stress detectionMICRON TECHNOLOGY INC·Filed 2019·Granted Nov 30, 2021·1 cites·25 claims
- 3774US8243526B2Depletion mode circuit protection deviceSMITH MICHAEL·Filed 2009·Granted Aug 14, 2012·5 cites·15 claims
- 3874US7119568B2Methods for wafer level burn-inMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 10, 2006·5 cites·10 claims
- 3974US5568435ACircuit for SRAM test mode isolated bitline modulationMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 22, 1996·28 cites·20 claims
- 4073US12362244B2Memory device including circuitry under bond padsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 4173US6751150B2Circuits and method to protect a gate dielectric antifuseMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 15, 2004·16 cites·50 claims
- 4273US6551864B2Fuse for use in a semiconductor device, and semiconductor devices including the fuseMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 22, 2003·12 cites·32 claims
- 4371US7075763B2Methods, circuits, and applications using a resistor and a Schottky diodeMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 11, 2006·13 cites·31 claims
- 4470US12354669B2Discharge circuitsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 8, 2025·0 cites·23 claims
- 4570US11978680B2Method and apparatus for on-chip stress detectionMICRON TECHNOLOGY INC·Filed 2021·Granted May 7, 2024·0 cites·20 claims
- 4670US7279918B2Methods for wafer level burn-inMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 9, 2007·3 cites·7 claims
- 4770US7215134B2Apparatus for determining burn-in reliability from wafer level burn-inMICRON TECHNOLOGY INC·Filed 2005·Granted May 8, 2007·3 cites·19 claims
- 4869US11823731B2Semiconductor device protection circuits, and associated methods, devices, and systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Nov 21, 2023·0 cites·17 claims
- 4969US6584030B2Memory circuit regulation system and methodMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 24, 2003·16 cites·52 claims
- 5068US11966303B2Memory system failure detection and self recovery of memory diceMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 23, 2024·0 cites·20 claims
Showing the top 50 of 82 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →