Inventor · disambiguated record
Kenneth Miu
Also filed as: MIU KENNETH · MIU KENNETH V
4 granted patents·30 citations·filing 1997–2007
72Inventor score
Technology areasG11C
Top patents by PatentIndex Score
4 records- 0161US6687157B1Circuits and methods for identifying a defective memory cell via first, second and third wordline voltagesXILINX INC·Filed 2003·Granted Feb 3, 2004·12 cites·19 claims
- 0252US5920506AMethod and apparatus for bulk preprogramming flash memory cells with minimal source and drain currentsHYUNDAI ELECTRONICS AMERICA·Filed 1997·Granted Jul 6, 1999·15 cites·14 claims
- 0348US7649771B2Method for decreasing program disturb in memory cellsSEMICONDUCTOR MFG INT SHANGHAI·Filed 2007·Granted Jan 19, 2010·3 cites·9 claims
- 0430US7668009B2Method of decreasing program disturb in memory cellsSEMICONDUCTOR MFG INT SHANGHAI·Filed 2007·Granted Feb 23, 2010·0 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Kenneth Miu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →