Inventor · disambiguated record
Keigo Nakatani
Also filed as: NAKATANI KEIGO
11 granted patents·6 pending applications·22 citations·filing 2008–2025
82Inventor score
Top patents by PatentIndex Score
17 records- 0185US7804372B2Ring oscillator for temperature sensor, temperature sensor circuit, and semiconductor device having the sameFUJITSU LTD·Filed 2008·Granted Sep 28, 2010·15 cites·20 claims
- 0280US10608594B2Doherty amplifierMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Mar 31, 2020·5 cites·4 claims
- 0374US2025330128A1AmplifierMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 0466US10523158B2Load modulation amplifierMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Dec 31, 2019·2 cites·17 claims
- 0557US2024364272A1Low distortion amplifierMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0656US11336233B2AmplifierMITSUBISHI ELECTRIC CORP·Filed 2020·Granted May 17, 2022·0 cites·5 claims
- 0754US2024056037A1Doherty amplifierMITSUBISHI ELECTRIC CORP·Filed 2023·Application pending·0 cites
- 0850US2023048682A1Doherty amplifierMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 0944US11133781B2Doherty amplifier and Doherty amplifier circuitMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Sep 28, 2021·0 cites·5 claims
- 1043US8093936B2Semiconductor device and control method thereofNAKATANI KEIGO·Filed 2009·Granted Jan 10, 2012·0 cites·4 claims
- 1139US10748860B2AmplifierMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Aug 18, 2020·0 cites·4 claims
- 1239US7999648B2Wire-wound coil and method for manufacturing wire-wound coilMURATA MANUFACTURING CO·Filed 2010·Granted Aug 16, 2011·0 cites·3 claims
- 1336US10911003B2Doherty amplifierMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Feb 2, 2021·0 cites·9 claims
- 1435US2014340975A1Semiconductor integrated circuit and method of testing semiconductor integrated circuitFUJITSU LTD·Filed 2014·Application pending·0 cites
- 1534US10340855B2Doherty amplifierMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Jul 2, 2019·0 cites·11 claims
- 1632US2020136564A1Doherty amplifier and amplification circuitMITSUBISHI ELECTRIC CORP·Filed 2017·Application pending·0 cites
- 1730US8412983B2Memory test circuit, semiconductor integrated circuit, and memory test methodNAKATANI KEIGO·Filed 2009·Granted Apr 2, 2013·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →